Study of Total-Ionizing-Dose Effects on a Single-Event-Hardened Phase-Locked Loop
文献类型：期刊论文
| 作者 | Chen, Zhuojun; Ding, Ding1; Dong, Yemin2; Shan, Yi2; Zhou, Shuxing3; Hu, Yuanyuan; Zheng, Yunlong2; Peng, Chao4; Chen, Rongmei5 |
| 刊名 | IEEE TRANSACTIONS ON NUCLEAR SCIENCE
 |
| 出版日期 | 2018 |
| 卷号 | 65期号:4页码:997 |
| 关键词 | Phase-locked loop (PLL) phase noise reference spur total ionizing dose (TID) |
| ISSN号 | 0018-9499 |
| DOI | 10.1109/TNS.2018.2812806 |
| 英文摘要 | The sensitivity of total-ionizing-dose (TID) response on a single-event hardened phase-locked loop (PLL) fabricated in a 130-nm silicon-on-insulator process is investigated. Based on the study of device parameter degradation under radiation exposure, the changes of dc and RF performance of the PLL have been presented. TID experiments on the PLL show that the power-down current increases by 1.5 times, and the tuning range drops by 11.5%. At 600 MHz and up to 500 krad(Si), the integrated phase noise increases by 29.2%, and the reference spur increases by 3.4 dB. Finally, the mechanism underlying impact of TID on the phase noise and reference spur has been discussed comprehensively, which combined measured observations with circuit modeling and simulations. |
| 学科主题 | Engineering, Electrical & Electronic ; Nuclear Science & Technology |
| WOS记录号 | WOS:000429967200004 |
| 出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
| 资助机构 | This work was supported in part by the Fundamental Research Funds for the Central Universities under Grant 2014YJS137, in part by the Key Research Program of the Chinese Academy of Sciences under Grant KGFZD-135-16-015, in part by the CAS Pioneer Hundred Talents Program, and in part by the National Nature Science Foundation of China under Grant 61704031. ; This work was supported in part by the Fundamental Research Funds for the Central Universities under Grant 2014YJS137, in part by the Key Research Program of the Chinese Academy of Sciences under Grant KGFZD-135-16-015, in part by the CAS Pioneer Hundred Talents Program, and in part by the National Nature Science Foundation of China under Grant 61704031. |
| 源URL | [http://ir.sic.ac.cn/handle/331005/25040]  |
| 专题 | 中国科学院上海硅酸盐研究所 |
| 作者单位 | 1.Hunan Univ, Sch Phys & Elect, Minist Educ, Key Lab Micronano Optoelect Devices, Changsha 410082, Hunan, Peoples R China 2.Chinese Acad Sci, Shanghai Inst Ceram, Key Lab Inorgan Coating Mat, Shanghai 200050, Peoples R China 3.Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China 4.Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Key Lab Funct Mat & Devices Special Environm, Urumqi 830011, Peoples R China 5.China Elect Product Reliabil & Environm Testing R, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Guangdong, Peoples R China 6.Tsinghua Univ, Key Lab Particle & Radiat Imaging, Minist Educ, Dept Engn Phys, Beijing 100084, Peoples R China |
| 推荐引用方式 GB/T 7714 | Chen, Zhuojun,Ding, Ding,Dong, Yemin,et al. Study of Total-Ionizing-Dose Effects on a Single-Event-Hardened Phase-Locked Loop[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE,2018,65(4):997, 1004. |
| APA | Chen, Zhuojun.,Ding, Ding.,Dong, Yemin.,Shan, Yi.,Zhou, Shuxing.,...&Chen, Rongmei.(2018).Study of Total-Ionizing-Dose Effects on a Single-Event-Hardened Phase-Locked Loop.IEEE TRANSACTIONS ON NUCLEAR SCIENCE,65(4),997. |
| MLA | Chen, Zhuojun,et al."Study of Total-Ionizing-Dose Effects on a Single-Event-Hardened Phase-Locked Loop".IEEE TRANSACTIONS ON NUCLEAR SCIENCE 65.4(2018):997. |
入库方式： OAI收割
来源：上海硅酸盐研究所
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