In-situ TEM mechanical characterization of nanowire in atomic scale using MEMS device
文献类型：期刊论文
| 作者 | Zhang, Xiao1; Yang, Yang1; Xu, Fangfang2; Li, Tie; Wang, Yuelin |
| 刊名 | MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS
 |
| 出版日期 | 2018 |
| 卷号 | 24期号:4页码:2045 |
| ISSN号 | 0946-7076 |
| DOI | 10.1007/s00542-017-3601-8 |
| 英文摘要 | This paper presents an experimental method for atomic-scale observation of in situ transmission electron microscopy (TEM) tensile test using micro-electromechanical systems (MEMS) actuator. A carefully designed and fabricated thermal actuator was applied in a standard double-tilt TEM holder to provide precisely controllable stretching process. To demonstrate the capabilities of the tensile testing system, some copper nanowires were stretched under a slowly force loading and in situ atomic resolution images were achieved. In addition, some faults releasing processes were observed during the tensile stretching and the corresponding strain-stress curve was calculated. The implemented actuator for atomic-scale observation can potentially have broad application to studies of nanoscale materials. |
| 学科主题 | Engineering, Electrical & Electronic ; Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied |
| WOS记录号 | WOS:000427064200030 |
| 出版者 | SPRINGER |
| 资助机构 | This work was supported by National Basic Research Program of China (973 Program Nos. 2012CB934102), National Science and Technology Supporting Program granted (No. 2012BAJ11B01), Creative Research of National Natura Science Foundation of China (No. 61321492), the National Natural Science Foundation of China (No. 91123037), and Shanghai Outstanding Academic leaders (No. 15XD1504300). ; This work was supported by National Basic Research Program of China (973 Program Nos. 2012CB934102), National Science and Technology Supporting Program granted (No. 2012BAJ11B01), Creative Research of National Natura Science Foundation of China (No. 61321492), the National Natural Science Foundation of China (No. 91123037), and Shanghai Outstanding Academic leaders (No. 15XD1504300). |
| 源URL | [http://ir.sic.ac.cn/handle/331005/25052]  |
| 专题 | 中国科学院上海硅酸盐研究所 |
| 作者单位 | 1.Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Sci & Technol Microsyst Lab, Shanghai, Peoples R China 2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China 3.Chinese Acad Sci, Shanghai Inst Ceram, Anal Testing Ctr Inorgan Mat, Shanghai, Peoples R China |
| 推荐引用方式 GB/T 7714 | Zhang, Xiao,Yang, Yang,Xu, Fangfang,et al. In-situ TEM mechanical characterization of nanowire in atomic scale using MEMS device[J]. MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS,2018,24(4):2045, 2049. |
| APA | Zhang, Xiao,Yang, Yang,Xu, Fangfang,Li, Tie,&Wang, Yuelin.(2018).In-situ TEM mechanical characterization of nanowire in atomic scale using MEMS device.MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS,24(4),2045. |
| MLA | Zhang, Xiao,et al."In-situ TEM mechanical characterization of nanowire in atomic scale using MEMS device".MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS 24.4(2018):2045. |
入库方式： OAI收割
来源：上海硅酸盐研究所
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