Rapid and accurate characterization of silver-paste metallization on crystalline silicon solar cells by contact-end voltage measurement
文献类型：期刊论文
| 作者 | Xiong, Shenghu1; Li, Yongsheng1; Liu, Cui1; Yuan, Xiao1; Tong, Hua1; Yang, Yuxia1; Ye, Xiaojun1; Wang, Xianhao2; Luo, Lan3 |
| 刊名 | AIP Advances
 |
| 出版日期 | 2018 |
| 卷号 | 8期号:9 |
| DOI | 10.1063/1.5038127 |
| 英文摘要 | Contact-end voltage measurement was applied to characterize the contact-formation process of silver paste metallization on p- and n-type crystalline silicon solar cells under different temperatures with well-designed fixtures and test patterns based on the circular transmission line model. The contact-end voltage values were found to be sensitive to sintering temperature, and the current density and contact end voltage curves of both contacts were linear, stating that the contacts were ohmic contacts. Their symbols on the n-type emitter reversed from negative to positive under the established connection mode, which indicated conductive-path changes manifested in the form of macroscopic electrical properties under insufficient, optimal, and over-fired conditions. We inferred that the conductive channel variations were mainly caused by the silver crystallites that precipitated on the emitter surface from the combination of the cross-sectional and interface morphology analyses. No similar phenomenon was observed on the p-type emitter for the few silver crystallites or silver-aluminum alloy without conductive-path alternation. Their values were much greater than those of the n-emitter, which agreed with the present industrial n-type cell characteristics. The measurement improved our understanding of the contact formation process, and can be used as a flexible approach for researchers to optimize the silver-paste formula and sintering processes for high-efficiency solar cells. © 2018 Author(s). |
| 出版者 | American Institute of Physics Inc. |
| 源URL | [http://ir.sic.ac.cn/handle/331005/25193]  |
| 专题 | 中国科学院上海硅酸盐研究所 |
| 作者单位 | 1.School of Materials Science and Engineering, East China University of Science and Technology, Shanghai; 200237, China; 2.Carle Zeiss (Shanghai) Co. Ltd., Shanghai; 200131, China; 3.Shanghai Institute of Ceramics, Chinese Academy of Science, Shanghai; 200131, China |
| 推荐引用方式 GB/T 7714 | Xiong, Shenghu,Li, Yongsheng,Liu, Cui,et al. Rapid and accurate characterization of silver-paste metallization on crystalline silicon solar cells by contact-end voltage measurement[J]. AIP Advances,2018,8(9). |
| APA | Xiong, Shenghu.,Li, Yongsheng.,Liu, Cui.,Yuan, Xiao.,Tong, Hua.,...&Luo, Lan.(2018).Rapid and accurate characterization of silver-paste metallization on crystalline silicon solar cells by contact-end voltage measurement.AIP Advances,8(9). |
| MLA | Xiong, Shenghu,et al."Rapid and accurate characterization of silver-paste metallization on crystalline silicon solar cells by contact-end voltage measurement".AIP Advances 8.9(2018). |
入库方式： OAI收割
来源：上海硅酸盐研究所
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