Nanoscale mapping of dielectric properties based on surface adhesion force measurements
文献类型：期刊论文
| 作者 | Wang, Ying1,2; Shen, Yue3; Wang, Xingya1,2,4; Shen, Zhiwei1,2,4; Li, Bin1,2; Hui, Jun1,2; Zhang, Yi1,2 |
| 刊名 | BEILSTEIN JOURNAL OF NANOTECHNOLOGY
 |
| 出版日期 | 2018-03-16 |
| 卷号 | 9页码:900-906 |
| 关键词 | Adhesion Atomic Force Microscopy (Afm) Graphene Oxide (Go) Nanoscale Dielectric Properties Reduced Graphene Oxide (Rgo) |
| 文献子类 | Article |
| 英文摘要 | The detection of local dielectric properties is of great importance in a wide variety of scientific studies and applications. Here, we report a novel method for the characterization of local dielectric distributions based on surface adhesion mapping by atomic force microscopy (AFM). The two-dimensional (2D) materials graphene oxide (GO), and partially reduced graphene oxide (RGO), which have similar thicknesses but large differences in their dielectric properties, were studied as model systems. Through direct imaging of the samples with a biased AFM tip in PeakForce Quantitative Nano-Mechanics (PF-QNM) mode, the local dielectric properties of GO and RGO were revealed by mapping their surface adhesion forces. Thus, GO and RGO could be conveniently differentiated. This method provides a simple and general approach for the fast characterization of the local dielectric properties of graphene-based materials and will further facilitate their applications in energy generation and storage devices. |
| WOS关键词 | SCANNING PROBE MICROSCOPY ; GRAPHENE OXIDE SHEETS ; LARGE ENERGY DENSITY ; POLYMER NANOCOMPOSITES ; GRAPHITE OXIDE ; COMPOSITES ; CONSTANT ; MEMBRANES ; FILMS |
| WOS研究方向 | Science & Technology - Other Topics ; Materials Science ; Physics |
| 语种 | 英语 |
| WOS记录号 | WOS:000428094400001 |
| 源URL | [http://ir.isl.ac.cn/handle/363002/6439]  |
| 专题 | 青海盐湖研究所_青海盐湖研究所知识仓储 |
| 作者单位 | 1.Chinese Acad Sci, Shanghai Inst Appl Phys, Key Lab Interfacial Phys & Technol, Shanghai 201800, Peoples R China 2.Chinese Acad Sci, Shanghai Inst Appl Phys, Lab Phys Biol, Shanghai 201800, Peoples R China 3.Chinese Acad Sci, Qinghai Inst Salt Lakes, Key Lab Salt Lake Resources Chem Qinghai Prov, Xining 810008, Qinghai, Peoples R China 4.Univ Chinese Acad Sci, Beijing 100049, Peoples R China |
| 推荐引用方式 GB/T 7714 | Wang, Ying,Shen, Yue,Wang, Xingya,et al. Nanoscale mapping of dielectric properties based on surface adhesion force measurements[J]. BEILSTEIN JOURNAL OF NANOTECHNOLOGY,2018,9:900-906. |
| APA | Wang, Ying.,Shen, Yue.,Wang, Xingya.,Shen, Zhiwei.,Li, Bin.,...&Zhang, Yi.(2018).Nanoscale mapping of dielectric properties based on surface adhesion force measurements.BEILSTEIN JOURNAL OF NANOTECHNOLOGY,9,900-906. |
| MLA | Wang, Ying,et al."Nanoscale mapping of dielectric properties based on surface adhesion force measurements".BEILSTEIN JOURNAL OF NANOTECHNOLOGY 9(2018):900-906. |
入库方式： OAI收割
来源：青海盐湖研究所
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