Imaging of three-dimensional objects in emission electron microscopy
文献类型：期刊论文
| 作者 | Nepijko, SA; Sedov, NN; Schmidt, O; Schonhense, G; Bao, X; Huang, W |
| 刊名 | journal of microscopy-oxford
 |
| 出版日期 | 2001-06-01 |
| 卷号 | 202页码:480-487 |
| 关键词 | contact potential difference (CPD) defocusing emission electron microscope (EEM) |
| 英文摘要 | under investigation by emission electron microscopy, the shape and size of three-dimensional objects are distorted because of the appearance of a characteristic potential relief and a possible contact potential difference between the particles and the substrate. an estimation of these effects for spherical particles is made. it is shown that the apparent size of particles observed in an emission electron microscope (eem) could be increased as well as decreased depending on the relation between the work functions of the particle and the substrate. the corresponding formulae are given and several possibilities are shown which permit us to determine from the eem image the real size of particles and their work function relative to the substrate. |
| WOS标题词 | science & technology ; technology |
| 类目[WOS] | microscopy |
| 研究领域[WOS] | microscopy |
| 收录类别 | SCI |
| 原文出处 | true |
| 语种 | 英语 |
| WOS记录号 | WOS:000169614900006 |
| 公开日期 | 2010-11-30 |
| 源URL | [http://159.226.238.44/handle/321008/91999]  |
| 专题 | 大连化学物理研究所_中国科学院大连化学物理研究所 |
| 作者单位 | 1.Univ Mainz, Inst Phys, D-55099 Mainz, Germany 2.Natl Acad Sci Ukraine, Inst Phys, UA-03650 Kiev, CIS, Ukraine 3.Moscow Mil Inst, Moscow 109380, CIS, Russia 4.Chinese Acad Sci, Dalian Inst Chem Phys, Dalian 116023, Peoples R China |
| 推荐引用方式 GB/T 7714 | Nepijko, SA,Sedov, NN,Schmidt, O,et al. Imaging of three-dimensional objects in emission electron microscopy[J]. journal of microscopy-oxford,2001,202:480-487. |
| APA | Nepijko, SA,Sedov, NN,Schmidt, O,Schonhense, G,Bao, X,&Huang, W.(2001).Imaging of three-dimensional objects in emission electron microscopy.journal of microscopy-oxford,202,480-487. |
| MLA | Nepijko, SA,et al."Imaging of three-dimensional objects in emission electron microscopy".journal of microscopy-oxford 202(2001):480-487. |
入库方式： OAI收割
来源：大连化学物理研究所
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