Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy
文献类型:期刊论文
作者 | Gao, Peng1,2,3,4; Harder, Irina4; Nercissian, Vanusch2; Mantel, Klaus4; Yao, Baoli1![]() |
刊名 | optics letters
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出版日期 | 2010-03-01 |
卷号 | 35期号:5页码:712-714 |
ISSN号 | 0146-9592 |
英文摘要 | a new common-path and in-line point-diffraction interferometer for quantitative phase microscopy is proposed. the interferometer is constructed by introducing a grating pair into the point-diffraction interferometer, thus forming a common-path and in-line configuration for object and reference waves. achromatic phase shifting is implemented by linearly moving one of the two gratings in its grating vector direction. the feasibility of the proposed configuration is demonstrated by theoretical analysis and experiments. (c) 2010 optical society of america |
WOS标题词 | science & technology ; physical sciences |
类目[WOS] | optics |
研究领域[WOS] | optics |
关键词[WOS] | lateral shearing interferometer ; grating interferometer ; dynamics |
收录类别 | SCI ; EI |
语种 | 英语 |
WOS记录号 | WOS:000275826700033 |
公开日期 | 2011-07-08 |
源URL | [http://ir.opt.ac.cn/handle/181661/9819] ![]() |
专题 | 西安光学精密机械研究所_瞬态光学技术国家重点实验室 |
作者单位 | 1.Chinese Acad Sci, State Key Lab Transient Opt & Photon, Xian Inst Opt & Precis Mech, Xian 710119, Peoples R China 2.Univ Erlangen Nurnberg, Inst Opt Informat & Photon, Erlangen, Germany 3.Chinese Acad Sci, Grad Sch, Beijing 100039, Peoples R China 4.Max Planck Inst Sci Light, Erlangen, Germany |
推荐引用方式 GB/T 7714 | Gao, Peng,Harder, Irina,Nercissian, Vanusch,et al. Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy[J]. optics letters,2010,35(5):712-714. |
APA | Gao, Peng,Harder, Irina,Nercissian, Vanusch,Mantel, Klaus,&Yao, Baoli.(2010).Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy.optics letters,35(5),712-714. |
MLA | Gao, Peng,et al."Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy".optics letters 35.5(2010):712-714. |
入库方式: OAI收割
来源:西安光学精密机械研究所
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