Soft x-ray induced photoreduction of organic cu(ii) compounds probed by x-ray absorption near-edge (xanes) spectroscopy
文献类型：期刊论文
| 作者 | Yang, Jianjun2; Regier, Tom3; Dynes, James J.3; Wang, Jian3; Shi, Jiyan; Peak, Derek4; Zhao, Yidong5; Hu, Tiandou5; Chen, Yingxu1; Tse, John S.2 |
| 刊名 | Analytical chemistry
 |
| 出版日期 | 2011-10-15 |
| 卷号 | 83期号:20页码:7856-7862 |
| ISSN号 | 0003-2700 |
| DOI | 10.1021/ac201622g |
| 通讯作者 | Chen, yingxu(yxchen@zju.edu.cn) |
| 英文摘要 | Photoreduction is a major obstacle for using the x-ray absorption near-edge structure (xcanes) fingerprint to perform metal speciation at the molecular level in biological and environmental samples, especially for metalloproteins. in this study, soft x-ray induced photoreduction was observed in organic cu(ii) compounds during xanes measurements in a third generation synchrotron source. next cu l(3)-edge, o k-edge, and c k-edge xanes spectroscopy, together with the scanning transmission x-ray microscopy (stxm), were used to probe the specific radiation damage processes of cu acetate with similar local structures to cu metalloproteins. breakup of the cu-cu bond was hypothesized for the initial photoreduction of cu acetate. the following radiation damage of cu acetate produced cuo and an organic cu(i) compound with a c=c bond, and the further photoreduction of the resulting cuo to cu metal was also demonstrated our results indicated the importance of consideration of photoreduction during soft xanes measurements for the solid state compounds with high valence metals. reducing the radiation dose to similar to 0.1 mgy effectively prevented the photoreduction of organic cu(ii) compounds during these measurements. this proposed radiation damage mechanism in cu acetate may be generally useful in explaining the photoreduction process in cu metalloproteins. |
| WOS关键词 | K-EDGE ; CRYOGENIC TEMPERATURES ; RADIATION-DAMAGE ; POROUS SILICON ; ACTIVE-SITES ; CU-A ; COPPER ; SPECIATION ; METAL ; COMPLEXES |
| WOS研究方向 | Chemistry |
| WOS类目 | Chemistry, Analytical |
| 语种 | 英语 |
| WOS记录号 | WOS:000295817500039 |
| 出版者 | AMER CHEMICAL SOC |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2176160 |
| 专题 | 高能物理研究所 |
| 通讯作者 | Chen, Yingxu |
| 作者单位 | 1.Zhejiang Univ, Dept Environm Engn, Inst Environm Sci & Technol, Hangzhou 310029, Zhejiang, Peoples R China 2.Univ Saskatchewan, Dept Phys & Engn Phys, Saskatoon, SK S7N 5E2, Canada 3.Univ Saskatchewan, Canadian Light Source Inc, Saskatoon, SK S7N 0X4, Canada 4.Univ Saskatchewan, Dept Soil Sci, Saskatoon, SK S7N 5A8, Canada 5.Chinese Acad Sci, Inst High Energy Phys, Beijing Synchrotron Radiat Facil, Beijing 100049, Peoples R China |
| 推荐引用方式 GB/T 7714 | Yang, Jianjun,Regier, Tom,Dynes, James J.,et al. Soft x-ray induced photoreduction of organic cu(ii) compounds probed by x-ray absorption near-edge (xanes) spectroscopy[J]. Analytical chemistry,2011,83(20):7856-7862. |
| APA | Yang, Jianjun.,Regier, Tom.,Dynes, James J..,Wang, Jian.,Shi, Jiyan.,...&Tse, John S..(2011).Soft x-ray induced photoreduction of organic cu(ii) compounds probed by x-ray absorption near-edge (xanes) spectroscopy.Analytical chemistry,83(20),7856-7862. |
| MLA | Yang, Jianjun,et al."Soft x-ray induced photoreduction of organic cu(ii) compounds probed by x-ray absorption near-edge (xanes) spectroscopy".Analytical chemistry 83.20(2011):7856-7862. |
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