Structural characterization of la0.9ba0.1mno3/y-zro2 film by x-ray diffraction
文献类型：期刊论文
| 作者 | Tan, W. S.1; Wang, H. O.1; Dai, P.1; Wu, H. P.1; Wu, X. S.2; Jia, Q. J.3; Hu, G. J.4; Gao, J.5 |
| 刊名 | Physica b-condensed matter
 |
| 出版日期 | 2011-11-01 |
| 卷号 | 406期号:21页码:4115-4118 |
| 关键词 | La0.9ba0.1mno3 film Grazing incidence x-ray diffraction Strain relaxation Structural characterization |
| ISSN号 | 0921-4526 |
| DOI | 10.1016/j.physb.2011.08.005 |
| 通讯作者 | Tan, w. s.(tanweishi@mail.njust.edu.cn) |
| 英文摘要 | Perovskite manganite la0.9ba0.1mno3(lbmo) films were deposited on (0 0 1)-oriented single crystal yttria-stabilized zirconia (ysz) substrate by 90 degrees off-axis radio frequency magnetron sputtering. the film thickness ranged from 10 nm to 100nm. grazing incidence x-ray diffraction technique and high resolution x-ray diffraction were applied to characterize the structure of lbmo films. the lbmo film mainly consisted of (0 0 1)-orientated grain as well as weakly textured (1 1 0)-orientated grain. the results indicated that an amorphous layer with thickness of about 4 nm was formed at the lbmo/ysz interface. the strainin lbmo film was small and averaged to be about -0.14%. the strain in the film was not lattice mismatch-induced strain but residual strain due to the difference in thermal expansion coefficient between film and substrate. (c) 2011 elsevier b.v. all rights reserved . |
| WOS关键词 | MANGANITE THIN-FILMS ; MAGNETORESISTANCE ; INTERFACE ; GROWTH ; LA0.67CA0.33MNO3 ; MICROSTRUCTURE ; LA2/3CA1/3MNO3 ; TRANSPORT |
| WOS研究方向 | Physics |
| WOS类目 | Physics, Condensed Matter |
| 语种 | 英语 |
| WOS记录号 | WOS:000295468900024 |
| 出版者 | ELSEVIER SCIENCE BV |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2176163 |
| 专题 | 高能物理研究所 |
| 通讯作者 | Tan, W. S. |
| 作者单位 | 1.Nanjing Univ Sci & Technol, Key Lab Soft Chem & Funct Mat, Minist Educ, Dept Appl Phys, Nanjing 210094, Peoples R China 2.Nanjing Univ, Natl Key Lab Solid State Microstruct, Dept Phys, Nanjing 210093, Peoples R China 3.Chinese Acad Sci, Inst High Energy Phys, Beijing 100039, Peoples R China 4.Chinese Acad Sci, Natl Lab Infrared Phys, Shanghai Inst Tech Phys, Shanghai 200083, Peoples R China 5.Univ Hong Kong, Dept Phys, Hong Kong, Hong Kong, Peoples R China |
| 推荐引用方式 GB/T 7714 | Tan, W. S.,Wang, H. O.,Dai, P.,et al. Structural characterization of la0.9ba0.1mno3/y-zro2 film by x-ray diffraction[J]. Physica b-condensed matter,2011,406(21):4115-4118. |
| APA | Tan, W. S..,Wang, H. O..,Dai, P..,Wu, H. P..,Wu, X. S..,...&Gao, J..(2011).Structural characterization of la0.9ba0.1mno3/y-zro2 film by x-ray diffraction.Physica b-condensed matter,406(21),4115-4118. |
| MLA | Tan, W. S.,et al."Structural characterization of la0.9ba0.1mno3/y-zro2 film by x-ray diffraction".Physica b-condensed matter 406.21(2011):4115-4118. |
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