Enhancing primary processing for small-angle x-ray scattering
文献类型：期刊论文
| 作者 | Wei, Yanru1,2; Li, Zhihong1 |
| 刊名 | Instrumentation science & technology
 |
| 出版日期 | 2017 |
| 卷号 | 45期号:1页码:22-34 |
| 关键词 | Detector tilt Primary data processing Program Small-angle x-ray scattering |
| ISSN号 | 1073-9149 |
| DOI | 10.1080/10739149.2016.1205084 |
| 通讯作者 | Li, zhihong(lzh@ihep.ac.cn) |
| 英文摘要 | A program is reported for primary processing of small-angle x-ray scattering from various cameras. the software integrates basic functions necessary for primary processing that include instrument parameter calibration, scattering angle calibration, the conversion of a two-dimensional image to a one-dimensional curve, background and absorption subtraction, and correction for collimation effects. all instrument parameters for primary processing needs were derived with high precision by fitting a diffraction ring of a standard without the measurement of other parameters. the program is applicable whether the detector photosensitive plane is vertical or tilted with respect to the direct beam and operates easily, automatically, and rapidly on windows computers. this article describes the structure, function, and features of the software. |
| WOS研究方向 | Chemistry ; Instruments & Instrumentation |
| WOS类目 | Chemistry, Analytical ; Instruments & Instrumentation |
| 语种 | 英语 |
| WOS记录号 | WOS:000384404800003 |
| 出版者 | TAYLOR & FRANCIS INC |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2176638 |
| 专题 | 高能物理研究所 |
| 通讯作者 | Li, Zhihong |
| 作者单位 | 1.Chinese Acad Sci, Inst High Energy Phys, Beijing Synchrotron Radiat Facil, POB 918, Beijing 100049, Peoples R China 2.Anhui Univ, Inst Hlth Sci, Hefei, Peoples R China |
| 推荐引用方式 GB/T 7714 | Wei, Yanru,Li, Zhihong. Enhancing primary processing for small-angle x-ray scattering[J]. Instrumentation science & technology,2017,45(1):22-34. |
| APA | Wei, Yanru,&Li, Zhihong.(2017).Enhancing primary processing for small-angle x-ray scattering.Instrumentation science & technology,45(1),22-34. |
| MLA | Wei, Yanru,et al."Enhancing primary processing for small-angle x-ray scattering".Instrumentation science & technology 45.1(2017):22-34. |
入库方式： iSwitch采集
来源：高能物理研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。