Evaluation of a pulse counting type soi pixel using synchrotron radiation x-ray
文献类型:期刊论文
作者 | Hashimoto, R.1; Arai, Y.2; Igarashi, N.1; Kumai, R.1; Lu, Y.3; Miyoshi, T.2; Nishimura, R.4; Ouyang, Q.3; Zhou, Y.3; Kishimoto, S.1 |
刊名 | Journal of instrumentation |
出版日期 | 2017-03-01 |
卷号 | 12页码:6 |
ISSN号 | 1748-0221 |
关键词 | X-ray detectors X-ray diffraction detectors |
DOI | 10.1088/1748-0221/12/03/c03061 |
通讯作者 | Hashimoto, r.(ryo.hashimoto@kek.jp) |
英文摘要 | Silicon-on-insulator (soi) technology was used to develop a fine pixelated detector with high performance. the first beam test for a prototype pulse-counting-type soi chip, cpixteg3b, was performed at beamline bl-14a of the photon factory, kek. cpixteg3b was designed using double soi technology for decreasing crosstalk and increasing radiation hardness. it has a 64 x 64 pixel array wherein each pixel size is 50 mu m x 50 mu m. the sensitivity to incident x-rays was measured for each pixel with an x-ray beam 10 mu m in diameter. we used the x-ray energy of 16 kev. because of its small size, the pixel response was sensitive to the charge-sharing effect. we also considered the point spread function of the sensor. the discriminator of each pixel circuit was calibrated using a pulse generator, and performance was checked using flat-field x-rays. |
WOS关键词 | PROCESS TECHNOLOGY |
WOS研究方向 | Instruments & Instrumentation |
WOS类目 | Instruments & Instrumentation |
语种 | 英语 |
出版者 | IOP PUBLISHING LTD |
WOS记录号 | WOS:000406997400061 |
URI标识 | http://www.irgrid.ac.cn/handle/1471x/2176934 |
专题 | 高能物理研究所 |
通讯作者 | Hashimoto, R. |
作者单位 | 1.KEK, Inst Mat Struct Sci, 1-1 Oho, Tsukuba, Ibaraki 3050801, Japan 2.KEK, Inst Particle & Nucl Studies, 1-1 Oho, Tsukuba, Ibaraki 3050801, Japan 3.Chinese Acad Sci, Inst High Energy Phys, State Key Lab Particle Detect & Elect, Beijing 100049, Peoples R China 4.SOKENDAI, Sch High Energy Accelerator Sci, 1-1 Oho, Tsukuba, Ibaraki 3050801, Japan |
推荐引用方式 GB/T 7714 | Hashimoto, R.,Arai, Y.,Igarashi, N.,et al. Evaluation of a pulse counting type soi pixel using synchrotron radiation x-ray[J]. Journal of instrumentation,2017,12:6. |
APA | Hashimoto, R..,Arai, Y..,Igarashi, N..,Kumai, R..,Lu, Y..,...&Kishimoto, S..(2017).Evaluation of a pulse counting type soi pixel using synchrotron radiation x-ray.Journal of instrumentation,12,6. |
MLA | Hashimoto, R.,et al."Evaluation of a pulse counting type soi pixel using synchrotron radiation x-ray".Journal of instrumentation 12(2017):6. |
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来源:高能物理研究所
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