Application of seu imaging for analysis of device architecture using a 25 mev/u kr-86 ion microbeam at hirfl
文献类型：期刊论文
| 作者 | Liu, Tianqi1,2,3; Yang, Zhenlei4; Guo, Jinlong1; Du, Guanghua1; Tong, Teng5; Wang, Xiaohui1; Su, Hong1; Liu, Wenjing1; Liu, Jiande1; Wang, Bin1 |
| 刊名 | Nuclear instruments & methods in physics research section b-beam interactions with materials and atoms
 |
| 出版日期 | 2017-08-01 |
| 卷号 | 404页码:254-258 |
| 关键词 | Heavy-ion microbeam High-energy Single event upset Fpga Imaging |
| ISSN号 | 0168-583X |
| DOI | 10.1016/j.nimb.2017.01.069 |
| 通讯作者 | Liu, jie(j.liu@impcas.ac.cn) |
| 英文摘要 | The heavy-ion imaging of single event upset (seu) in a flash-based field programmable gate array (fpga) device was carried out for the first time at heavy ion research facility in lanzhou (hirfl). the three shift register chains with separated input and output configurations in device under test (dut) were used to identify the corresponding logical area rapidly once an upset occurred. the logic units in dut were partly configured in order to distinguish the registers in seu images. based on the above settings, the partial architecture of shift register chains in dut was imaged by employing the microbeam of kr-86 ion with energy of 25 mev/u in air. the results showed that the physical distribution of registers in dut had a high consistency with its logical arrangement by comparing seu image with logic configuration in scanned area. (c) 2017 elsevier b.v. all rights reserved. |
| WOS关键词 | SINGLE EVENT UPSET ; INDUCED CHARGE ; POWER MOSFETS ; SYSTEM ; EPILAYER ; BURNOUT ; BULK ; SOI |
| WOS研究方向 | Instruments & Instrumentation ; Nuclear Science & Technology ; Physics |
| WOS类目 | Instruments & Instrumentation ; Nuclear Science & Technology ; Physics, Atomic, Molecular & Chemical ; Physics, Nuclear |
| 语种 | 英语 |
| WOS记录号 | WOS:000404709900048 |
| 出版者 | ELSEVIER SCIENCE BV |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2177279 |
| 专题 | 高能物理研究所 |
| 通讯作者 | Liu, Jie |
| 作者单位 | 1.Chinese Acad Sci, Inst Modern Phys, Nanchang Rd 509, Lanzhou 730000, Peoples R China 2.Lanzhou Univ, Sch Phys Sci & Technol, Lanzhou 730000, Peoples R China 3.Univ Chinese Acad Sci, Beijing 100049, Peoples R China 4.Chinese Acad Sci, Technol & Engn Ctr Space Utilizat, Beijing 100094, Peoples R China 5.Chinese Acad Sci, Inst High Energy Phys, Beijing 100049, Peoples R China |
| 推荐引用方式 GB/T 7714 | Liu, Tianqi,Yang, Zhenlei,Guo, Jinlong,et al. Application of seu imaging for analysis of device architecture using a 25 mev/u kr-86 ion microbeam at hirfl[J]. Nuclear instruments & methods in physics research section b-beam interactions with materials and atoms,2017,404:254-258. |
| APA | Liu, Tianqi.,Yang, Zhenlei.,Guo, Jinlong.,Du, Guanghua.,Tong, Teng.,...&Liu, Jie.(2017).Application of seu imaging for analysis of device architecture using a 25 mev/u kr-86 ion microbeam at hirfl.Nuclear instruments & methods in physics research section b-beam interactions with materials and atoms,404,254-258. |
| MLA | Liu, Tianqi,et al."Application of seu imaging for analysis of device architecture using a 25 mev/u kr-86 ion microbeam at hirfl".Nuclear instruments & methods in physics research section b-beam interactions with materials and atoms 404(2017):254-258. |
入库方式： iSwitch采集
来源：高能物理研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。