Optimum design of electron bombarded active pixel sensor for low-level light single photon imaging
文献类型:会议论文
作者 | Bai, Jinzhou1,2; Wang, Bo1![]() ![]() |
出版日期 | 2019 |
会议日期 | 2018-06-26 |
会议地点 | Chengdu, PEOPLES R CHINA |
关键词 | EBAPS LLLI single photon detection charge collection efficiency |
DOI | 10.1117/12.2506350 |
产权排序 | 1 |
会议录 | 9TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTOELECTRONIC MATERIALS AND DEVICES FOR SENSING AND IMAGING
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语种 | 英语 |
ISSN号 | 0277786X;1996759X |
ISBN号 | 9781510623286 |
WOS记录号 | WOS:000465823200030 |
源URL | [http://ir.opt.ac.cn/handle/181661/31299] ![]() |
专题 | 空间科学微光探测技术研究室 |
作者单位 | 1.Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology of CAS, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an; 710119, China; 2.University of Chinese Academy of Sciences, Beijing; 100094, China |
推荐引用方式 GB/T 7714 | Bai, Jinzhou,Wang, Bo,Bai, Yonglin,et al. Optimum design of electron bombarded active pixel sensor for low-level light single photon imaging[C]. 见:. Chengdu, PEOPLES R CHINA. 2018-06-26. |
入库方式: OAI收割
来源:西安光学精密机械研究所
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