中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Optimum design of electron bombarded active pixel sensor for low-level light single photon imaging

文献类型:会议论文

作者Bai, Jinzhou1,2; Wang, Bo1; Bai, Yonglin1; Cao, Weiwei1; Yang, Yang1; Lei, Fanpu1; Su, Dan2
出版日期2019
会议日期2018-06-26
会议地点Chengdu, PEOPLES R CHINA
关键词EBAPS LLLI single photon detection charge collection efficiency
DOI10.1117/12.2506350
产权排序1
会议录9TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTOELECTRONIC MATERIALS AND DEVICES FOR SENSING AND IMAGING
语种英语
ISSN号0277786X;1996759X
ISBN号9781510623286
WOS记录号WOS:000465823200030
源URL[http://ir.opt.ac.cn/handle/181661/31299]  
专题空间科学微光探测技术研究室
作者单位1.Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology of CAS, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an; 710119, China;
2.University of Chinese Academy of Sciences, Beijing; 100094, China
推荐引用方式
GB/T 7714
Bai, Jinzhou,Wang, Bo,Bai, Yonglin,et al. Optimum design of electron bombarded active pixel sensor for low-level light single photon imaging[C]. 见:. Chengdu, PEOPLES R CHINA. 2018-06-26.

入库方式: OAI收割

来源:西安光学精密机械研究所

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