Degradation Location Study of Proton Exchange Membrane at Open Circuit Operation
文献类型：会议论文
| 作者 | Xiao SH(肖少华) ; Zhang HM(张华民) ; Bi C(毕成) ; Zhang YN(张益宁) |
| 出版日期 | 2010-07-11 |
| 会议名称 | the 8th international symposium on new materials and nano-materials for electrochemical systems |
| 会议日期 | 2010-7-11 |
| 会议地点 | 中国 |
| 页码 | 55/2 |
| 通讯作者 | 张华民 |
| 中文摘要 | open circuit voltage(ocv)test is widely accepted as an accelerated test for evaluatiing membrane durability. free radicals (ho and hoo)are usually thought to be responsible for membrane degradation. the accelerated degradation at ocv test is generally attributed to the radicals generated by crossover gas. the membrane degradation can only happen in the case of the coexistence of h2, o2 and catalyst[1-2], so the radicals could be generated at anode/cathode side[3-4], suggesting the radical-initiated membrane degradation could occur at anode or cathode side under ocv condition. however, the location of chemical degradation at ocv test is still ambiguous. |
| 会议主办者 | 上海交通大学 |
| 学科主题 | 物理化学 |
| 语种 | 中文 |
| 源URL | [http://159.226.238.44/handle/321008/114240]  |
| 专题 | 大连化学物理研究所_中国科学院大连化学物理研究所 |
| 推荐引用方式 GB/T 7714 | Xiao SH,Zhang HM,Bi C,et al. Degradation Location Study of Proton Exchange Membrane at Open Circuit Operation[C]. 见:the 8th international symposium on new materials and nano-materials for electrochemical systems. 中国. 2010-7-11. |
入库方式： OAI收割
来源：大连化学物理研究所
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