SEE Characteristics of COTS Devices by 1064nm Pulsed Laser Backside Testing
文献类型：会议论文
| 作者 | Ma, Yingqi1,2; Han, Jianwei1,2; Shangguan, Shipeng1,2; Chen, Rui1; Zhu, Xiang1,2; Li, Yue1; Zhan, Yueying2,3 |
| 出版日期 | 2018 |
| 会议日期 | July 16, 2018 - July 20, 2018 |
| 会议地点 | Waikoloa, HI, United states |
| DOI | 10.1109/NSREC.2018.8584271 |
| 英文摘要 | Commercial-off-the-shelf (COTS) devices are selected to use in the satellite instruments for the convenience with high performance and low cost. This work presents the results and analysis investigating on Single Event Upset (SEU) and Single Event Latch-up (SEL) characteristics of the COTS devices by backside laser testing. The modified equivalent LET (ELET) and its uncertainty are verified by the laser and heavy ion testing of several CMOS devices. © 2018 IEEE. |
| 会议录 | 2018 IEEE Nuclear and Space Radiation Effects Conference, NSREC 2018
 |
| 语种 | 英语 |
| ISBN号 | 9781538682630 |
| 源URL | [http://ir.nssc.ac.cn/handle/122/6925]  |
| 专题 | 国家空间科学中心_保障部/保障与试验验证中心 |
| 作者单位 | 1.National Space Science Center, Chinese Academy of Sciences, Beijing; 100190, China; 2.University of Chinese Academy of Sciences, Beijing; 100049, China; 3.Technology and Engineering Center for Space Utilization, Chinese Academy of Sciences, Beijing; 100094, China |
| 推荐引用方式 GB/T 7714 | Ma, Yingqi,Han, Jianwei,Shangguan, Shipeng,et al. SEE Characteristics of COTS Devices by 1064nm Pulsed Laser Backside Testing[C]. 见:. Waikoloa, HI, United states. July 16, 2018 - July 20, 2018. |
入库方式： OAI收割
来源：国家空间科学中心
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