Investigation of the reverse recovery characteristics of vertical bulk GaN-based Schottky rectifiers
文献类型：期刊论文
| 作者 | Gu, Hong(顾泓); Zhang, Zhiqiang(张志强); Zhou, Taofei(周桃飞) ; Xu, Ke(徐科); Tian, Feifei(田飞飞); Liu, Lei(刘磊); Wang, Jianfeng(王建峰)
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| 刊名 | JOURNAL OF PHYSICS D-APPLIED PHYSICS
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| 出版日期 | 2018 |
| 其他题名 | Investigation of the reverse recovery characteristics of vertical bulk GaN-based Schottky rectifiers |
| 语种 | 英语 |
| 源URL | [http://ir.sinano.ac.cn/handle/332007/6144]  |
| 专题 | 苏州纳米技术与纳米仿生研究所_测试分析平台 |
| 作者单位 | 中国科学院苏州纳米技术与纳米仿生研究所 |
| 推荐引用方式 GB/T 7714 | Gu, Hong,Zhang, Zhiqiang,Zhou, Taofei,et al. Investigation of the reverse recovery characteristics of vertical bulk GaN-based Schottky rectifiers[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2018. |
| APA | Gu, Hong.,Zhang, Zhiqiang.,Zhou, Taofei.,Xu, Ke.,Tian, Feifei.,...&Wang, Jianfeng.(2018).Investigation of the reverse recovery characteristics of vertical bulk GaN-based Schottky rectifiers.JOURNAL OF PHYSICS D-APPLIED PHYSICS. |
| MLA | Gu, Hong,et al."Investigation of the reverse recovery characteristics of vertical bulk GaN-based Schottky rectifiers".JOURNAL OF PHYSICS D-APPLIED PHYSICS (2018). |
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