Influence factors and temperature reliability of ohmic contact on AlGaN/GaN HEMTs
文献类型:期刊论文
作者 | Fan, Yaming(范亚明)![]() ![]() ![]() ![]() ![]() |
刊名 | AIP ADVANCES
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出版日期 | 2018 |
其他题名 | Influence factors and temperature reliability of ohmic contact on AlGaN/GaN HEMTs |
语种 | 英语 |
源URL | [http://ir.sinano.ac.cn/handle/332007/6253] ![]() |
专题 | 苏州纳米技术与纳米仿生研究所_纳米加工公共平台 |
作者单位 | 中国科学院苏州纳米技术与纳米仿生研究所 |
推荐引用方式 GB/T 7714 | Fan, Yaming,Song, Liang,Cai, Yong,et al. Influence factors and temperature reliability of ohmic contact on AlGaN/GaN HEMTs[J]. AIP ADVANCES,2018. |
APA | Fan, Yaming.,Song, Liang.,Cai, Yong.,Zhang, Baoshun.,Zhao, Jie.,...&Yu, Guohao.(2018).Influence factors and temperature reliability of ohmic contact on AlGaN/GaN HEMTs.AIP ADVANCES. |
MLA | Fan, Yaming,et al."Influence factors and temperature reliability of ohmic contact on AlGaN/GaN HEMTs".AIP ADVANCES (2018). |
入库方式: OAI收割
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