中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Influence factors and temperature reliability of ohmic contact on AlGaN/GaN HEMTs

文献类型:期刊论文

作者Fan, Yaming(范亚明); Song, Liang(宋亮); Cai, Yong(蔡勇); Zhang, Baoshun(张宝顺); Zhao, Jie; Chen, Fu(陈扶); Fu, Kai(付凯); Zhang, Xiaodong(张晓东); Hao, Ronghui(郝荣晖); Yu, Guohao(于国浩)
刊名AIP ADVANCES
出版日期2018
其他题名Influence factors and temperature reliability of ohmic contact on AlGaN/GaN HEMTs
语种英语
源URL[http://ir.sinano.ac.cn/handle/332007/6253]  
专题苏州纳米技术与纳米仿生研究所_纳米加工公共平台
作者单位中国科学院苏州纳米技术与纳米仿生研究所
推荐引用方式
GB/T 7714
Fan, Yaming,Song, Liang,Cai, Yong,et al. Influence factors and temperature reliability of ohmic contact on AlGaN/GaN HEMTs[J]. AIP ADVANCES,2018.
APA Fan, Yaming.,Song, Liang.,Cai, Yong.,Zhang, Baoshun.,Zhao, Jie.,...&Yu, Guohao.(2018).Influence factors and temperature reliability of ohmic contact on AlGaN/GaN HEMTs.AIP ADVANCES.
MLA Fan, Yaming,et al."Influence factors and temperature reliability of ohmic contact on AlGaN/GaN HEMTs".AIP ADVANCES (2018).

入库方式: OAI收割

来源:苏州纳米技术与纳米仿生研究所

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