Quadratic electromechanical strain in silicon investigated by scanning probe microscopy.
文献类型：期刊论文
| 作者 | Zhu, Qingfeng; Shan, Dongliang; Jia, Tingting; Xie, Shuhong; Li, Jiangyu; Yu, Junxi; Esfahani, Ehsan Nasr |
| 刊名 | JOURNAL OF APPLIED PHYSICS
 |
| 出版日期 | 2018 |
| 文献子类 | 期刊论文 |
| 英文摘要 | Piezoresponse force microscopy (PFM) is a powerful tool widely used to characterize piezoelectricity and ferroelectricity at the nanoscale. However, it is necessary to distinguish microscopic mechanisms between piezoelectricity and non-piezoelectric contributions measured by PFM. In this work, we systematically investigate the first and second harmonic apparent piezo-responses of a silicon wafer in both vertical and lateral modes, and we show that it exhibits an apparent electromechanical response that is quadratic to the applied electric field, possibly arising from ionic electrochemical dipoles induced by the charged probe. As a result, the electromechanical response measured is dominated by the second harmonic response in the vertical mode, and its polarity can be switched by the DC voltage with the evolving coercive field and maximum amplitude, in sharp contrast to typical ferroelectric materials we used as control. The ionic activity in silicon is also confirmed by the scanning thermo-ionic microscopy measurement, and the work points toward a set of methods to distinguish true piezoelectricity from the apparent ones. Published by AIP Publishing. |
| URL标识 | 查看原文 |
| 语种 | 英语 |
| 源URL | [http://ir.siat.ac.cn:8080/handle/172644/14392]  |
| 专题 | 深圳先进技术研究院_医工所 |
| 推荐引用方式 GB/T 7714 | Zhu, Qingfeng,Shan, Dongliang,Jia, Tingting,et al. Quadratic electromechanical strain in silicon investigated by scanning probe microscopy.[J]. JOURNAL OF APPLIED PHYSICS,2018. |
| APA | Zhu, Qingfeng.,Shan, Dongliang.,Jia, Tingting.,Xie, Shuhong.,Li, Jiangyu.,...&Esfahani, Ehsan Nasr.(2018).Quadratic electromechanical strain in silicon investigated by scanning probe microscopy..JOURNAL OF APPLIED PHYSICS. |
| MLA | Zhu, Qingfeng,et al."Quadratic electromechanical strain in silicon investigated by scanning probe microscopy.".JOURNAL OF APPLIED PHYSICS (2018). |
入库方式： OAI收割
来源：深圳先进技术研究院
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