Energy dispersive spectroscopy analysis of aluminium segregation in silicon carbide grain boundaries
文献类型：期刊论文
| 作者 | Zhang, XF; Yang, Q; De Jonghe, LC; Zhang, Z |
| 刊名 | Journal of microscopy-oxford
 |
| 出版日期 | 2002-07-01 |
| 卷号 | 207页码:58-68 |
| 关键词 | Al Energy-dispersive spectroscopy Grain boundary Impurity Sic Transmission electron microscopy |
| ISSN号 | 0022-2720 |
| 通讯作者 | Zhang, xf() |
| 英文摘要 | The aluminium distribution in polycrystalline sic hot-pressed with aluminium, boron and carbon additives was studied using x-ray energy-dispersive spectroscopy (eds) and transmission electron microscopy (tem). the al excess in homophase sic grain boundary films was determined, taking into account dissolved al in the sic lattice. in the spot-eds analysis, an electron beam probe with a calibrated diameter was formed, and the total beam-specimen interaction volume was defined, taking the beam spreading through crystalline tem foil into consideration. eds spectra were collected from regions containing intergranular films and adjacent matrix grains, respectively. a theoretical treatment was presented and experimental errors were estimated, with a further discussion about the effects of foil thickness. experimental examples are given, followed by statistical eds analyses for grain boundary films in sic samples hot-pressed with increased amounts of al additions. the results demonstrated a substantial al segregation in the nanometer-wide intergranular films in all samples. al additions higher than 3 wt% saturated the al concentrations in sic grains and in grain boundary films. the effect of foil thickness, and the parameters for determining the optimum incident beam diameter in the eds analysis are discussed. |
| WOS关键词 | ANALYTICAL ELECTRON-MICROSCOPE ; X-RAY-MICROANALYSIS ; SPATIAL-RESOLUTION ; THIN FOILS ; K-FACTORS ; NITRIDE ; SPECIMENS ; QUANTIFICATION ; DEFINITION ; CHEMISTRY |
| WOS研究方向 | Microscopy |
| WOS类目 | Microscopy |
| 语种 | 英语 |
| WOS记录号 | WOS:000177026900007 |
| 出版者 | BLACKWELL PUBLISHING LTD |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2373935 |
| 专题 | 物理研究所 |
| 通讯作者 | Zhang, XF |
| 作者单位 | 1.Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA 2.Univ Calif Berkeley, Dept Mat Sci & Mineral Engn, Berkeley, CA 94720 USA 3.Beijing Lab Electron Microscopy, Beijing 100080, Peoples R China |
| 推荐引用方式 GB/T 7714 | Zhang, XF,Yang, Q,De Jonghe, LC,et al. Energy dispersive spectroscopy analysis of aluminium segregation in silicon carbide grain boundaries[J]. Journal of microscopy-oxford,2002,207:58-68. |
| APA | Zhang, XF,Yang, Q,De Jonghe, LC,&Zhang, Z.(2002).Energy dispersive spectroscopy analysis of aluminium segregation in silicon carbide grain boundaries.Journal of microscopy-oxford,207,58-68. |
| MLA | Zhang, XF,et al."Energy dispersive spectroscopy analysis of aluminium segregation in silicon carbide grain boundaries".Journal of microscopy-oxford 207(2002):58-68. |
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