Characterization of periodicity fluctuations in ingan/gan mqws by the kinematical simulation of x-ray diffraction
文献类型：期刊论文
| 作者 | Li,Yangfeng1,2; Die,Junhui1,2; Yan,Shen1,2; Deng,Zhen1,2; Ma,Ziguang1,2; Wang,Lu1,2; Jia,Haiqiang1,2; Wang,Wenxin1,2; Jiang,Yang1,2; Chen,Hong1,2 |
| 刊名 | Applied physics express
 |
| 出版日期 | 2019-03-13 |
| 卷号 | 12期号:4 |
| ISSN号 | 1882-0778 |
| 关键词 | Xrd Mqws Interface roughness |
| DOI | 10.7567/1882-0786/ab0540 |
| 通讯作者 | Jiang,yang() ; Chen,hong() |
| 英文摘要 | Abstract x-ray diffraction patterns are widely used to calculate the periodicity fluctuation of multiple quantum wells (mqws). nonetheless, we find the commonly used formula sometimes cannot give an exact linear relationship between the full width at half maximum and the satellite peak orders. here, based on the formula, we deduce a more accurate formula to characterize the periodicity fluctuations in ingan/gan mqws. the revised formula has higher linearity correlation degree and the calculated interface roughness coincides well with x-ray reflectivity measurement results. |
| 语种 | 英语 |
| 出版者 | IOP Publishing |
| WOS记录号 | IOP:1882-0778-12-4-AB0540 |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2373981 |
| 专题 | 物理研究所 |
| 通讯作者 | Jiang,Yang; Chen,Hong |
| 作者单位 | 1.Key Laboratory for Renewable Energy, Beijing Key Laboratory for New Energy Materials and Devices, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, People’s Republic of China 2.University of Chinese Academy of Sciences, Beijing 100049, People’s Republic of China |
| 推荐引用方式 GB/T 7714 | Li,Yangfeng,Die,Junhui,Yan,Shen,et al. Characterization of periodicity fluctuations in ingan/gan mqws by the kinematical simulation of x-ray diffraction[J]. Applied physics express,2019,12(4). |
| APA | Li,Yangfeng.,Die,Junhui.,Yan,Shen.,Deng,Zhen.,Ma,Ziguang.,...&Chen,Hong.(2019).Characterization of periodicity fluctuations in ingan/gan mqws by the kinematical simulation of x-ray diffraction.Applied physics express,12(4). |
| MLA | Li,Yangfeng,et al."Characterization of periodicity fluctuations in ingan/gan mqws by the kinematical simulation of x-ray diffraction".Applied physics express 12.4(2019). |
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来源：物理研究所
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