Annealing of cdznte materials to reduce inclusion defects
文献类型:期刊论文
作者 | Xu, Chao1,2; Sheng, Fengfeng1,2; Yang, Jianrong1,2 |
刊名 | Journal of crystal growth |
出版日期 | 2016-10-01 |
卷号 | 451页码:126-131 |
ISSN号 | 0022-0248 |
关键词 | Cadmium zinc telluride Inclusion defects Annealing Infrared focal plane |
DOI | 10.1016/j.jcrysgro.2016.07.024 |
通讯作者 | Xu, chao() |
英文摘要 | Annealing of (cdzn)te substrate material is an important technology to enhance the quality of hgcdte epitaxial material as well as the performance of infrared focal plane array detectors. in this paper, the size variations of inclusions defects in (cdzn)te material after annealing were investigated. and the quantitative dependencies of the inclusion defect sizes on the sample temperature, cd partial pressure and annealing time were obtained. some properties of inclusion defects and rules of inclusion defect evolution in annealing were revealed. the models of the inclusion defects and the physical mechanism of annealing process based on atom diffusions were proposed to describe the experimental results. the research results can help us to better understand the evolution process of the inclusion defects in annealing and find suitable annealing technology to obtain high-quality (cdzn)te materials. (c) 2016 elsevier b.v. all rights reserved. |
WOS关键词 | SINGLE-CRYSTALS ; TE INCLUSIONS ; MORPHOLOGY EVOLUTION ; CDTE ; SURFACE ; RICH |
WOS研究方向 | Crystallography ; Materials Science ; Physics |
WOS类目 | Crystallography ; Materials Science, Multidisciplinary ; Physics, Applied |
语种 | 英语 |
出版者 | ELSEVIER SCIENCE BV |
WOS记录号 | WOS:000385321000019 |
URI标识 | http://www.irgrid.ac.cn/handle/1471x/2374836 |
专题 | 中国科学院大学 |
通讯作者 | Xu, Chao |
作者单位 | 1.Chinese Acad Sci, Shanghai Inst Tech Phys, Key Lab Infrared Image Mat & Devices, Shanghai 200080, Peoples R China 2.Univ Chinese Acad Sci, Beijing, Peoples R China |
推荐引用方式 GB/T 7714 | Xu, Chao,Sheng, Fengfeng,Yang, Jianrong. Annealing of cdznte materials to reduce inclusion defects[J]. Journal of crystal growth,2016,451:126-131. |
APA | Xu, Chao,Sheng, Fengfeng,&Yang, Jianrong.(2016).Annealing of cdznte materials to reduce inclusion defects.Journal of crystal growth,451,126-131. |
MLA | Xu, Chao,et al."Annealing of cdznte materials to reduce inclusion defects".Journal of crystal growth 451(2016):126-131. |
入库方式: iSwitch采集
来源:中国科学院大学
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