A bayesian approach to degradation-based burn-in optimization for display products exhibiting two-phase degradation patterns
文献类型：期刊论文
| 作者 | Yuan, Tao1; Bae, Suk Joo2; Zhu, Xiaoyan3 |
| 刊名 | Reliability engineering & system safety
 |
| 出版日期 | 2016-11-01 |
| 卷号 | 155页码:55-63 |
| ISSN号 | 0951-8320 |
| 关键词 | Burn-in Degradation model Gibbs sampling Hierarchical bayesian model Reliability |
| DOI | 10.1016/j.ress.2016.04.019 |
| 通讯作者 | Yuan, tao(yuan@ohio.edu) |
| 英文摘要 | Motivated by the two-phase degradation phenomena observed in light displays (e.g., plasma display panels (pdps), organic light emitting diodes (oleds)), this study proposes a new degradation-based burn-in testing plan for display products exhibiting two-phase degradation patterns. the primary focus of the burn-in test in this study is to eliminate the initial rapid degradation phase, while the major purpose of traditional burn-in tests is to detect and eliminate early failures from weak units. a hierarchical bayesian bi-exponential model is used to capture two-phase degradation patterns of the burn-in population. mission reliability and total cost are introduced as planning criteria. the proposed burn-in approach accounts for unit-to-unit variability within the burn-in population, and uncertainty concerning the model parameters, mainly in the hierarchical bayesian framework. available pre-burn-in data is conveniently incorporated into the burn-in decision-making procedure. a practical example of pdp degradation data is used to illustrate the proposed methodology. the proposed method is compared to other approaches such as the maximum likelihood method or the change-point regression. (c) 2016 elsevier ltd. all rights reserved. |
| WOS关键词 | CONDITION-BASED MAINTENANCE ; RESIDUAL-LIFE DISTRIBUTIONS ; HIGHLY RELIABLE PRODUCTS ; TO-FAILURE DISTRIBUTION ; STOCHASTIC DEGRADATION ; MEASUREMENT ERRORS ; SHOCK MODEL ; TIME ; SUBPOPULATIONS ; SIGNALS |
| WOS研究方向 | Engineering ; Operations Research & Management Science |
| WOS类目 | Engineering, Industrial ; Operations Research & Management Science |
| 语种 | 英语 |
| 出版者 | ELSEVIER SCI LTD |
| WOS记录号 | WOS:000382420800006 |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2375659 |
| 专题 | 中国科学院大学 |
| 通讯作者 | Yuan, Tao |
| 作者单位 | 1.Ohio Univ, Dept Ind & Syst Engn, Athens, OH 45701 USA 2.Hanyang Univ, Dept Ind Engn, Seoul, South Korea 3.Univ Chinese Acad Sci, Sch Econ & Management, Beijing, Peoples R China |
| 推荐引用方式 GB/T 7714 | Yuan, Tao,Bae, Suk Joo,Zhu, Xiaoyan. A bayesian approach to degradation-based burn-in optimization for display products exhibiting two-phase degradation patterns[J]. Reliability engineering & system safety,2016,155:55-63. |
| APA | Yuan, Tao,Bae, Suk Joo,&Zhu, Xiaoyan.(2016).A bayesian approach to degradation-based burn-in optimization for display products exhibiting two-phase degradation patterns.Reliability engineering & system safety,155,55-63. |
| MLA | Yuan, Tao,et al."A bayesian approach to degradation-based burn-in optimization for display products exhibiting two-phase degradation patterns".Reliability engineering & system safety 155(2016):55-63. |
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来源：中国科学院大学
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