中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Influences of the period of repeating thickness on the stress of alternative high and low refractivity zro2/sio2 multilayers

文献类型:期刊论文

作者Shao, SY; Fan, ZX; Shao, JD
刊名Acta physica sinica
出版日期2005-07-01
卷号54期号:7页码:3312-3316
关键词Zro2/sio2 multilayers Residual stress Periods of repeating thickness
ISSN号1000-3290
通讯作者Shao, sy(shaoshuying@siom.ac.cn)
英文摘要The effect of period of repeating thickness on the stress is studied in zro2/sio2 multilayers deposited by electron beam evaporation on bk7 glass and fused silica substrates, separately. the results show that the residual stress in the multilayers is compressive, and with the increase of the period of repeating thickness the residual stress in multilayers decrease in both bk7 and fused silica substrates. at the same time, the residual stress in multilayers deposited on bk7 glass substrates is less than that in the samples deposited on fused silica substrates. the variation of the microstructure examined by the x-ray diffraction shows that the microscopic deformation does not correspond to the macroscopic stress, which may be due to the variation of the interface stress.
WOS关键词INTERFACE STRESS ; THIN-FILMS
WOS研究方向Physics
WOS类目Physics, Multidisciplinary
语种英语
WOS记录号WOS:000230231700059
出版者CHINESE PHYSICAL SOC
URI标识http://www.irgrid.ac.cn/handle/1471x/2377763
专题中国科学院大学
通讯作者Shao, SY
作者单位1.Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Res & Dev Ctr Opt Thin Film Coatings, Shanghai 201800, Peoples R China
2.Chinese Acad Sci, Grad Sch, Beijing 100864, Peoples R China
推荐引用方式
GB/T 7714
Shao, SY,Fan, ZX,Shao, JD. Influences of the period of repeating thickness on the stress of alternative high and low refractivity zro2/sio2 multilayers[J]. Acta physica sinica,2005,54(7):3312-3316.
APA Shao, SY,Fan, ZX,&Shao, JD.(2005).Influences of the period of repeating thickness on the stress of alternative high and low refractivity zro2/sio2 multilayers.Acta physica sinica,54(7),3312-3316.
MLA Shao, SY,et al."Influences of the period of repeating thickness on the stress of alternative high and low refractivity zro2/sio2 multilayers".Acta physica sinica 54.7(2005):3312-3316.

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来源:中国科学院大学

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