Test resource partitioning based on efficient response compaction for test time and tester channels reduction
文献类型：期刊论文
| 作者 | Han, YH; Li, XW; Li, HW; Chandra, A |
| 刊名 | Journal of computer science and technology
 |
| 出版日期 | 2005-03-01 |
| 卷号 | 20期号:2页码:201-209 |
| 关键词 | System-on-a-chip (soc) Test resource partitioning (trp) Response compaction Diagnose Error cancellation |
| ISSN号 | 1000-9000 |
| 通讯作者 | Han, yh(yinhes@ict.ac.cn) |
| 英文摘要 | This paper presents a test resource partitioning technique based on an efficient response compaction design called quotient compactor(q-compactor). because q-compactor. is a single-output compactor, high compaction ratios can be obtained even for chips with a small number of outputs. some theorems for the design of q-compactor are presented to achieve full diagnostic ability, minimize error cancellation and handle unknown bits in the outputs of the circuit under test (cut). the q-compactor can also be moved to the load-board, so as to compact the output response of the cut even during functional testing. therefore, the number of tester channels required to test the chip is significantly reduced. the experimental results on the iscas '89 benchmark circuits and an mpeg 2 decoder soc show that the proposed compaction scheme is very efficient. |
| WOS关键词 | SPACE COMPACTORS |
| WOS研究方向 | Computer Science |
| WOS类目 | Computer Science, Hardware & Architecture ; Computer Science, Software Engineering |
| 语种 | 英语 |
| WOS记录号 | WOS:000227919000007 |
| 出版者 | SCIENCE CHINA PRESS |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2378005 |
| 专题 | 中国科学院大学 |
| 通讯作者 | Han, YH |
| 作者单位 | 1.Chinese Acad Sci, Comp Technol Inst, Beijing 100080, Peoples R China 2.Chinese Acad Sci, Grad Sch, Beijing 100039, Peoples R China 3.Synopsys Inc, Mountain View, CA 94043 USA |
| 推荐引用方式 GB/T 7714 | Han, YH,Li, XW,Li, HW,et al. Test resource partitioning based on efficient response compaction for test time and tester channels reduction[J]. Journal of computer science and technology,2005,20(2):201-209. |
| APA | Han, YH,Li, XW,Li, HW,&Chandra, A.(2005).Test resource partitioning based on efficient response compaction for test time and tester channels reduction.Journal of computer science and technology,20(2),201-209. |
| MLA | Han, YH,et al."Test resource partitioning based on efficient response compaction for test time and tester channels reduction".Journal of computer science and technology 20.2(2005):201-209. |
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来源：中国科学院大学
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