中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Heteroepitaxy of cdte on tilting si(211) substrates by molecular beam epitaxy

文献类型:期刊论文

作者Wang, YZ; Chen, L; Wu, Y; Wu, J; Yu, MF; He, L
刊名Journal of crystal growth
出版日期2006-05-01
卷号290期号:2页码:436-440
关键词High resolution x-ray diffraction Shear strain Molecular beam epitaxy Cdte Si
ISSN号0022-0248
DOI10.1016/j.jcrysgro.2006.01.048
通讯作者Wang, yz(yuanzhang_wang@yahoo.com.cn)
英文摘要Cdte(2 1 1)b epilayers were grown on 3 in si(2 1 1) substrates which misoriented 0-10 degrees toward [1 1 1] by molecular beam epitaxy (mbe). the relationship of x-ray double-crystal rocking curve (xrdcrc) fwhm and deflection angle from cdte(21 1) to si(21 1) was studied. for 4.2-4.5 degrees mu m cdte, the best value of fwhm 83 arcsec was achieved while deflection angle is 2.76 degrees. a fwhm wafer mapping indicated a good crystalline uniformity of 7.4 mu m cdte on tilting si(2 1 1), with fwhm range of 60-72 arcsec. the shear strains of these epilayers were analyzed, using reciprocal lattice points of symmetric and asymmetric reflections measured by high-resolution multi-crystal multi-reflection x-ray diffractometer (hrmcmrxd). it was found that the shear strain angle gamma((0 1 1)) of epilayer is effectively reduced by using proper tilting si(2 1 1) substrate. it was also proved that the lattice parameter of cdte(2 i i.)b is affected by the shear strain and thermal strain. (c) 2006 elsevier b.v. all rights reserved.
WOS关键词GROWTH ; CDTE(111)B ; SURFACES ; SILICON ; MBE
WOS研究方向Crystallography ; Materials Science ; Physics
WOS类目Crystallography ; Materials Science, Multidisciplinary ; Physics, Applied
语种英语
WOS记录号WOS:000237156400023
出版者ELSEVIER SCIENCE BV
URI标识http://www.irgrid.ac.cn/handle/1471x/2378717
专题中国科学院大学
通讯作者Wang, YZ
作者单位1.Chinese Acad Sci, Shanghai Inst Tech Phys, Res Ctr Adv Mat & Devices, Shanghai 200083, Peoples R China
2.Chinese Acad Sci, Grad Sch, Beijing 100039, Peoples R China
推荐引用方式
GB/T 7714
Wang, YZ,Chen, L,Wu, Y,et al. Heteroepitaxy of cdte on tilting si(211) substrates by molecular beam epitaxy[J]. Journal of crystal growth,2006,290(2):436-440.
APA Wang, YZ,Chen, L,Wu, Y,Wu, J,Yu, MF,&He, L.(2006).Heteroepitaxy of cdte on tilting si(211) substrates by molecular beam epitaxy.Journal of crystal growth,290(2),436-440.
MLA Wang, YZ,et al."Heteroepitaxy of cdte on tilting si(211) substrates by molecular beam epitaxy".Journal of crystal growth 290.2(2006):436-440.

入库方式: iSwitch采集

来源:中国科学院大学

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。