Embedded test resource for soc to reduce required tester channels based on advanced convolutional codes
文献类型：期刊论文
| 作者 | Han, YH; Li, XW; Li, HW; Chandra, A |
| 刊名 | Ieee transactions on instrumentation and measurement
 |
| 出版日期 | 2006-04-01 |
| 卷号 | 55期号:2页码:389-399 |
| 关键词 | Automatic test equipment Convolutional code Diagnosis Error cancellation Masking Unknown bits (x-bits) |
| ISSN号 | 0018-9456 |
| DOI | 10.1109/tim.2006.870332 |
| 通讯作者 | Han, yh(yinhes@ict.ac.cn) |
| 英文摘要 | Test resources can be embedded on the chip to reduce required external tester channels. in order to obtain the maximal reduction of tester channels, a single-output encoder based on the check matrix of the (n, n-1, m,3) convolutional code is presented. when the five proposed theorems are satisfied, the encoder can avoid two and any odd erroneous bit cancellations, handle one unknown bit (x-bit), and diagnose one erroneous bit. two types of encoders are proposed to implement the check matrix of the convolutional code. a large number of x-bits can be tolerated by choosing a proper memory size and weight of the check matrix, which can also be obtained by an optimized input assignment algorithm. in order to get the full diagnostic capability, the proposed encoder can be reconfigured into a simple linear-code-based encoder by adding some additional gates. experimental results show that the proposed encoder has an acceptable level of x-bits tolerance and a low aliasing probability. |
| WOS关键词 | ALIASING SPACE COMPACTION ; TEST RESPONSES ; CONSTRUCTIONS |
| WOS研究方向 | Engineering ; Instruments & Instrumentation |
| WOS类目 | Engineering, Electrical & Electronic ; Instruments & Instrumentation |
| 语种 | 英语 |
| WOS记录号 | WOS:000236331500003 |
| 出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2378810 |
| 专题 | 中国科学院大学 |
| 通讯作者 | Han, YH |
| 作者单位 | 1.Chinese Acad Sci, Adv Test Technol Lab, Inst Comp Technol, Beijing, Peoples R China 2.Grad Univ, Chinese Acad Sci, Beijing, Peoples R China 3.Synopsys Inc, Mountain View, CA 94043 USA |
| 推荐引用方式 GB/T 7714 | Han, YH,Li, XW,Li, HW,et al. Embedded test resource for soc to reduce required tester channels based on advanced convolutional codes[J]. Ieee transactions on instrumentation and measurement,2006,55(2):389-399. |
| APA | Han, YH,Li, XW,Li, HW,&Chandra, A.(2006).Embedded test resource for soc to reduce required tester channels based on advanced convolutional codes.Ieee transactions on instrumentation and measurement,55(2),389-399. |
| MLA | Han, YH,et al."Embedded test resource for soc to reduce required tester channels based on advanced convolutional codes".Ieee transactions on instrumentation and measurement 55.2(2006):389-399. |
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来源：中国科学院大学
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