Degradation location study of proton exchange membrane at open circuit operation
文献类型：期刊论文
| 作者 | Xiao, Shaohua1,2; Zhang, Huamin1; Bi, Cheng1,2; Zhang, Yu1; Zhang, Yining1,2; Dai, Hua1,2; Mai, Zhensheng1,2; Li, Xianfeng1 |
| 刊名 | journal of power sources
 |
| 出版日期 | 2010-08-15 |
| 卷号 | 195期号:16页码:5305-5311 |
| 关键词 | Degradation location Free radical Ceria Durability |
| 产权排序 | 1;1 |
| 通讯作者 | 张华民 |
| 英文摘要 | in order to investigate the location of the radical-initiated membrane degradation at open circuit operation, ceria (ceo(2)) nanoparticles are firstly placed at different locations of the membranes to scavenge free radicals generated there. scanning electron microscopy (sem) is used to characterize cross-sectional morphology of membrane before and after the open circuit voltage (ocv) test. ocv decay rate is used as an indicator of membrane degradation rate. composite membranes with ceo(2) nanoparticles facing anode or cathode show improved membrane durability than that of plain membrane in terms of ocv decay rate and cross-sectional morphology. ceo(2)-nafion composite membrane with the same thickness is subsequently proposed and it obtains the best durability. it is concluded that the chemical degradation at open circuit operation occurs at both sides of anode and cathode. (c) 2010 elsevier b.v. all rights reserved. |
| WOS标题词 | science & technology ; physical sciences ; technology |
| 类目[WOS] | electrochemistry ; energy & fuels |
| 研究领域[WOS] | electrochemistry ; energy & fuels |
| 关键词[WOS] | electrolyte fuel-cells ; polymer electrolyte ; chemical degradation ; perfluorosulfonic acid ; ionomer membranes ; pt/c catalysts ; durability ; mechanism ; performance ; mitigation |
| 收录类别 | SCI |
| 原文出处 | false |
| 语种 | 英语 |
| WOS记录号 | WOS:000277868600017 |
| 公开日期 | 2010-11-30 |
| 源URL | [http://159.226.238.44/handle/321008/103523]  |
| 专题 | 大连化学物理研究所_中国科学院大连化学物理研究所 |
| 作者单位 | 1.Chinese Acad Sci, Dalian Inst Chem Phys, Lab PEMFC Key Mat & Technol, Dalian 116023, Peoples R China 2.Chinese Acad Sci, Grad Univ, Beijing 100039, Peoples R China |
| 推荐引用方式 GB/T 7714 | Xiao, Shaohua,Zhang, Huamin,Bi, Cheng,et al. Degradation location study of proton exchange membrane at open circuit operation[J]. journal of power sources,2010,195(16):5305-5311. |
| APA | Xiao, Shaohua.,Zhang, Huamin.,Bi, Cheng.,Zhang, Yu.,Zhang, Yining.,...&Li, Xianfeng.(2010).Degradation location study of proton exchange membrane at open circuit operation.journal of power sources,195(16),5305-5311. |
| MLA | Xiao, Shaohua,et al."Degradation location study of proton exchange membrane at open circuit operation".journal of power sources 195.16(2010):5305-5311. |
入库方式： OAI收割
来源：大连化学物理研究所
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