中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Spice model for ldd structure cmos device at 35k

文献类型:期刊论文

作者Liu Wen-Yong1,2; Ding Rui-Jun1; Feng Qi1
刊名Journal of infrared and millimeter waves
出版日期2008-12-01
卷号27期号:6页码:465-469
关键词Lightly doped drain(ldd) Series resistance Bsim3v3 Spice model Cmos Low temperature
ISSN号1001-9014
通讯作者Liu wen-yong()
英文摘要Since the abnormal series resistance caused by ldd structure for cmos device at 35k temperature could not be simulated by bsim3v3 model, new macro models were introduced to represent the change of ldd series resistance. simulation results exhibit that the i-v characteristics of the macro model match well with the measurement. finally, the cmos transmission gate and two-stage amplifier were simulated with new bsim3v3 model ill addition to the macro model. the results reveal that the change of ldd series resistance has obvious effects on low temperature cmos circuits.
WOS研究方向Optics
WOS类目Optics
语种英语
WOS记录号WOS:000262060000016
出版者SCIENCE PRESS
URI标识http://www.irgrid.ac.cn/handle/1471x/2390831
专题中国科学院大学
通讯作者Liu Wen-Yong
作者单位1.Chinese Acad Sci, Shanghai Inst Tech Phys, Shanghai 200083, Peoples R China
2.Chinese Acad Sci, Grad Sch, Beijing 100039, Peoples R China
推荐引用方式
GB/T 7714
Liu Wen-Yong,Ding Rui-Jun,Feng Qi. Spice model for ldd structure cmos device at 35k[J]. Journal of infrared and millimeter waves,2008,27(6):465-469.
APA Liu Wen-Yong,Ding Rui-Jun,&Feng Qi.(2008).Spice model for ldd structure cmos device at 35k.Journal of infrared and millimeter waves,27(6),465-469.
MLA Liu Wen-Yong,et al."Spice model for ldd structure cmos device at 35k".Journal of infrared and millimeter waves 27.6(2008):465-469.

入库方式: iSwitch采集

来源:中国科学院大学

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。