中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Oxidant addition effect on ge(2)sb(2)te(5) phase change film chemical mechanical polishing

文献类型:期刊论文

作者Zhong, Min1,2; Song, Zhitang1; Liu, Bo1; Feng, Songlin1; Chen, Bomy3
刊名Journal of the electrochemical society
出版日期2008
卷号155期号:11页码:H929-h931
ISSN号0013-4651
DOI10.1149/1.2979146
通讯作者Zhong, min(minzhong@mail.sim.ac.cn)
英文摘要We studied the oxidant addition effect on chemical mechanical polishing (cmp) of ge(2)sb(2)te(5) (gst) phase change film. atomic force microscopy and scanning electron microscopy (sem) were used to characterize gst cmp performance. the surface roughness was reduced from 2.9 to 0.8 nm by oxidant (h(2)o(2)) addition. the surface chemical state of gst after being dipped in static condition ( absence of polishing) was measured by x-ray photoelectron spectroscopy (xps) and the surface top view conducted by sem. the data showed that ge, sb, and te had been oxidized by h(2)o(2) and the surface oxide layer was formed. the oxidation mechanisms of gst alloy are briefly discussed in terms of xps spectra and oxide theory. finally, the chemical effect on the gst cmp process is discussed and presented with previous results. (c) 2008 the electrochemical society.
WOS关键词CHANGE MEMORY
WOS研究方向Electrochemistry ; Materials Science
WOS类目Electrochemistry ; Materials Science, Coatings & Films
语种英语
WOS记录号WOS:000259528200076
出版者ELECTROCHEMICAL SOC INC
URI标识http://www.irgrid.ac.cn/handle/1471x/2392861
专题中国科学院大学
通讯作者Zhong, Min
作者单位1.Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Lab Nanotechnol, Shanghai 200050, Peoples R China
2.Chinese Acad Sci, Grad Univ, Beijing 100039, Peoples R China
3.Silicon Storage Technol Inc, Sunnyvale, CA 94086 USA
推荐引用方式
GB/T 7714
Zhong, Min,Song, Zhitang,Liu, Bo,et al. Oxidant addition effect on ge(2)sb(2)te(5) phase change film chemical mechanical polishing[J]. Journal of the electrochemical society,2008,155(11):H929-h931.
APA Zhong, Min,Song, Zhitang,Liu, Bo,Feng, Songlin,&Chen, Bomy.(2008).Oxidant addition effect on ge(2)sb(2)te(5) phase change film chemical mechanical polishing.Journal of the electrochemical society,155(11),H929-h931.
MLA Zhong, Min,et al."Oxidant addition effect on ge(2)sb(2)te(5) phase change film chemical mechanical polishing".Journal of the electrochemical society 155.11(2008):H929-h931.

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来源:中国科学院大学

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