中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Influence of overcoat on laser-induced damage threshold of 532 and 800 nm tio2/sio2 high reflectors

文献类型:期刊论文

作者Yao, Jianke1,2; Fan, Zhengxiu1; He, Hongbo1; Shao, Jianda1
刊名Optik
出版日期2009
卷号120期号:11页码:509-513
关键词Overcoat Tio2/sio2 high reflectors Laser damage
ISSN号0030-4026
DOI10.1016/j.ijleo.2007.12.010
通讯作者Yao, jianke(yjk@siom.ac.cn)
英文摘要Tio2/sio2 high reflectors with and without a sio2 overcoat are deposited by electron-beam evaporation. the film properties are characterized by visible spectrometry measures, structure analysis, roughness and laser-induced damage threshold (lidt) tests, surface defects and damage morphology observation. the effects of overcoats on lidt at 532 nm, 8 ns and 800 nm, 220 ps laser pulses are investigated. the relations between film structure, roughness, surface defects, electric field and lidt are discussed. it is found that overcoats can increase the lidt at these two laser wavelengths. the reduction of peak temperature, the low defects density and roughness, the low intrinsic absorption of sio2 and its amorphous structure are the main reasons for lidt improvement by overcoats. (c) 2008 elsevier gmbh. all rights reserved.
WOS研究方向Optics
WOS类目Optics
语种英语
WOS记录号WOS:000267461900001
出版者ELSEVIER GMBH, URBAN & FISCHER VERLAG
URI标识http://www.irgrid.ac.cn/handle/1471x/2401103
专题中国科学院大学
通讯作者Yao, Jianke
作者单位1.Shanghai Inst Opt & Fine Mech, R&D Ctr Opt Thin Film Coatings, Shanghai 201800, Peoples R China
2.Chinese Acad Sci, Grad Sch, Beijing 100080, Peoples R China
推荐引用方式
GB/T 7714
Yao, Jianke,Fan, Zhengxiu,He, Hongbo,et al. Influence of overcoat on laser-induced damage threshold of 532 and 800 nm tio2/sio2 high reflectors[J]. Optik,2009,120(11):509-513.
APA Yao, Jianke,Fan, Zhengxiu,He, Hongbo,&Shao, Jianda.(2009).Influence of overcoat on laser-induced damage threshold of 532 and 800 nm tio2/sio2 high reflectors.Optik,120(11),509-513.
MLA Yao, Jianke,et al."Influence of overcoat on laser-induced damage threshold of 532 and 800 nm tio2/sio2 high reflectors".Optik 120.11(2009):509-513.

入库方式: iSwitch采集

来源:中国科学院大学

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。