Extended selective encoding of scan slices for reducing test data and test power
文献类型：期刊论文
| 作者 | Liu, Jun1,2,3; Han, Yinhe1,2; Li, Xiaowei1,2 |
| 刊名 | Ieice transactions on information and systems
 |
| 出版日期 | 2010-08-01 |
| 卷号 | E93d期号:8页码:2223-2232 |
| 关键词 | Selective encoding Test data compression Test power reduction Flexible grouping X-filling |
| ISSN号 | 0916-8532 |
| DOI | 10.1587/transinf.e93.d.2223 |
| 通讯作者 | Liu, jun(liujun@ict.ac.cn) |
| 英文摘要 | Test data volume and test power are two major concerns when testing modern large circuits. recently, selective encoding of scan slices is proposed to compress test data. this encoding technique, unlike many other compression techniques encoding all the bits, only encodes the target-symbol by specifying a single bit index and copying group data. in this paper, we propose an extended selective encoding which presents two new techniques to optimize this method: a flexible grouping strategy, x bits exploitation and filling strategy. flexible grouping strategy can decrease the number of groups which need to be encoded and improve test data compression ratio. x bits exploitation and filling strategy can exploit a large number of don't care bits to reduce testing power with no compression ratio loss. experimental results show that the proposed technique needs less test data storage volume and reduces average weighted switching activity by 25.6% and peak weighted switching activity by 9.68% during scan shift compared to selective encoding. |
| WOS关键词 | TEST DATA-COMPRESSION ; REDUCTION ; ATPG |
| WOS研究方向 | Computer Science |
| WOS类目 | Computer Science, Information Systems ; Computer Science, Software Engineering |
| 语种 | 英语 |
| WOS记录号 | WOS:000281342300023 |
| 出版者 | IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2405888 |
| 专题 | 中国科学院大学 |
| 通讯作者 | Liu, Jun |
| 作者单位 | 1.Chinese Acad Sci, Grad Univ, Beijing 100864, Peoples R China 2.Chinese Acad Sci, Key Lab Comp Syst & Architecture, Inst Comp Technol, Beijing 100864, Peoples R China 3.Hefei Univ Technol, Sch Comp & Informat, Hefei, Peoples R China |
| 推荐引用方式 GB/T 7714 | Liu, Jun,Han, Yinhe,Li, Xiaowei. Extended selective encoding of scan slices for reducing test data and test power[J]. Ieice transactions on information and systems,2010,E93d(8):2223-2232. |
| APA | Liu, Jun,Han, Yinhe,&Li, Xiaowei.(2010).Extended selective encoding of scan slices for reducing test data and test power.Ieice transactions on information and systems,E93d(8),2223-2232. |
| MLA | Liu, Jun,et al."Extended selective encoding of scan slices for reducing test data and test power".Ieice transactions on information and systems E93d.8(2010):2223-2232. |
入库方式： iSwitch采集
来源：中国科学院大学
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。