Testable critical path selection considering process variation
文献类型：期刊论文
| 作者 | Fu, Xiang1,2; Li, Huawei1,2; Li, Xiaowei1,2 |
| 刊名 | Ieice transactions on information and systems
 |
| 出版日期 | 2010 |
| 卷号 | E93d期号:1页码:59-67 |
| 关键词 | Testable critical path selection Process variation |
| ISSN号 | 0916-8532 |
| DOI | 10.1587/transinf.e93.d.59 |
| 通讯作者 | Fu, xiang(fuxiang@ict.ac.cn) |
| 英文摘要 | Critical path selection is very important in delay testing. critical paths found by conventional static timing analysis (sta) tools are inadequate to represent the real timing of the circuit, since neither the testability of paths nor the statistical variation of cell delays caused by process variation is considered. this paper proposed a novel path selection method considering process variation. the circuit is firstly simplified by eliminating non-critical edges under statistical timing model, and then divided into sub-circuits, while each sub-circuit has only one prime input (pi) and one prime output (po). critical paths are selected only in critical sub-circuits. the concept of partially critical edges (pces) and completely critical edges, (cces) are introduced to speed up the path selection procedure. two path selection strategies are also presented to search for a testable critical path set to cover all the critical edges. the experimental results showed that the proposed circuit division approach is efficient in path number reduction, and pce's and cces play an important role as a guideline during path selection. |
| WOS研究方向 | Computer Science |
| WOS类目 | Computer Science, Information Systems ; Computer Science, Software Engineering |
| 语种 | 英语 |
| WOS记录号 | WOS:000274506200009 |
| 出版者 | IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2407938 |
| 专题 | 中国科学院大学 |
| 通讯作者 | Fu, Xiang |
| 作者单位 | 1.Chinese Acad Sci, Inst Comp Technol, Key Lab Comp Syst & Architecture, Beijing 100190, Peoples R China 2.Chinese Acad Sci, Grad Univ, Beijing 100039, Peoples R China |
| 推荐引用方式 GB/T 7714 | Fu, Xiang,Li, Huawei,Li, Xiaowei. Testable critical path selection considering process variation[J]. Ieice transactions on information and systems,2010,E93d(1):59-67. |
| APA | Fu, Xiang,Li, Huawei,&Li, Xiaowei.(2010).Testable critical path selection considering process variation.Ieice transactions on information and systems,E93d(1),59-67. |
| MLA | Fu, Xiang,et al."Testable critical path selection considering process variation".Ieice transactions on information and systems E93d.1(2010):59-67. |
入库方式： iSwitch采集
来源：中国科学院大学
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。