Preparation and characterization of patterned copper sulfide thin films on n-type tio2 film surfaces
文献类型：期刊论文
| 作者 | Lu, Yongjuan1,2; Yi, Gewen1; Jia, Junhong1; Liang, Yongmin1 |
| 刊名 | Applied surface science
 |
| 出版日期 | 2010-09-15 |
| 卷号 | 256期号:23页码:7316-7322 |
| 关键词 | Copper sulfide Thin film Micropattern Characterization Optical property |
| ISSN号 | 0169-4332 |
| DOI | 10.1016/j.apsusc.2010.05.072 |
| 通讯作者 | Jia, junhong(jhjia@licp.cas.cn) |
| 英文摘要 | Micro-arrayed patterns of p-type copper sulfide (cuxs) thin films with positive and negative features were deposited onto the surfaces of n-type tio2 semiconductor films via a selective nucleation and growth process from aqueous solution. the surface functional molecules of the uv photo-oxidised patterned sams were utilized to direct the nucleation and growth of cuxs crystallites. the resultant cuxs/tio2 composite films with negative and positive cuxs patterns on the tio2 film surface were investigated using sem, xrd, xps and a 3d surface profiler. it is demonstrated that regular and compact patterned films of cu2s crystallites had been deposited onto the n-type tio2 surface, with sharp edges demarcating the boundaries between the patterned cu2s region and the tio2 film region. the uv-vis spectra for three cu2s/tio2 films exhibit a wide absorption between 300 nm and 450 nm. the maximum wavelength differences in the spectra of cu2s/tio2 films and tio2 film were attributed to the added absorption of cu2s films at 302 nm and the unchanged adsorption of tio2 films. the absorption intensities of the cu2s/tio2 films could be varied in the uv-vis range using the cu2s patterned features (positive, negative). (c) 2010 elsevier b. v. all rights reserved. |
| WOS关键词 | SOLAR-CELLS ; DEPOSITION MECHANISM ; SOLUTION GROWTH ; LAYER ; CONVERSION ; NANOCOMPOSITES ; EFFICIENCY ; ABSORBER ; ARRAYS ; LIGHT |
| WOS研究方向 | Chemistry ; Materials Science ; Physics |
| WOS类目 | Chemistry, Physical ; Materials Science, Coatings & Films ; Physics, Applied ; Physics, Condensed Matter |
| 语种 | 英语 |
| WOS记录号 | WOS:000279592200063 |
| 出版者 | ELSEVIER SCIENCE BV |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2411691 |
| 专题 | 中国科学院大学 |
| 通讯作者 | Jia, Junhong |
| 作者单位 | 1.Chinese Acad Sci, Lanzhou Inst Chem Phys, State Key Lab Solid Lubricat, Lanzhou 730000, Peoples R China 2.Chinese Acad Sci, Grad Sch, Beijing 10049, Peoples R China |
| 推荐引用方式 GB/T 7714 | Lu, Yongjuan,Yi, Gewen,Jia, Junhong,et al. Preparation and characterization of patterned copper sulfide thin films on n-type tio2 film surfaces[J]. Applied surface science,2010,256(23):7316-7322. |
| APA | Lu, Yongjuan,Yi, Gewen,Jia, Junhong,&Liang, Yongmin.(2010).Preparation and characterization of patterned copper sulfide thin films on n-type tio2 film surfaces.Applied surface science,256(23),7316-7322. |
| MLA | Lu, Yongjuan,et al."Preparation and characterization of patterned copper sulfide thin films on n-type tio2 film surfaces".Applied surface science 256.23(2010):7316-7322. |
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来源：中国科学院大学
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