中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Structural and optical properties of quaternary alingan epilayers grown by mocvd with various tmga flows

文献类型:期刊论文

作者Liu, JP; Zhang, BS; Wu, M; Li, DB; Zhang, JC; Jin, RQ; Zhu, JJ; Chen, J; Wang, JF; Wang, YT
刊名Journal of crystal growth
出版日期2004-01-09
卷号260期号:3-4页码:388-393
关键词Triple-axis x-ray diffraction Atomic force microscopy Metalorganic chemical vapor deposition Alingan quaternary alloys
ISSN号0022-0248
DOI10.1016/j.jcrysgro.2003.09.007
通讯作者Liu, jp()
英文摘要Alingan quaternary epilayers have been grown with various tmga flows by metalorganic chemical vapor deposition to investigate the influence of growth rate on the structural and optical properties. triple-axis x-ray diffraction measurements show alingan epilayers have good crystalline quality. photolummescence (pl) measurements show that the emission intensity of alingan epilayers is twenty times stronger than that of algan epilayer with comparable al content. v-shaped pits are observed at the surface of alingan epilayers by atomic force microscopy (afm) and transmission electron microscopy (tem). high growth rate leads to increased density and size of v-shaped pits, but crystalline quality is not degraded. (c) 2003 elsevier b.v. all rights reserved.
WOS关键词MULTIPLE-QUANTUM WELLS ; ENHANCED LUMINESCENCE ; INXALYGA1-X-YN ; INGAN/GAN ; QUALITY
WOS研究方向Crystallography ; Materials Science ; Physics
WOS类目Crystallography ; Materials Science, Multidisciplinary ; Physics, Applied
语种英语
WOS记录号WOS:000187781300017
出版者ELSEVIER SCIENCE BV
URI标识http://www.irgrid.ac.cn/handle/1471x/2426247
专题半导体研究所
通讯作者Liu, JP
作者单位1.Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
2.Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat, Beijing 100083, Peoples R China
推荐引用方式
GB/T 7714
Liu, JP,Zhang, BS,Wu, M,et al. Structural and optical properties of quaternary alingan epilayers grown by mocvd with various tmga flows[J]. Journal of crystal growth,2004,260(3-4):388-393.
APA Liu, JP.,Zhang, BS.,Wu, M.,Li, DB.,Zhang, JC.,...&Yang, H.(2004).Structural and optical properties of quaternary alingan epilayers grown by mocvd with various tmga flows.Journal of crystal growth,260(3-4),388-393.
MLA Liu, JP,et al."Structural and optical properties of quaternary alingan epilayers grown by mocvd with various tmga flows".Journal of crystal growth 260.3-4(2004):388-393.

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来源:半导体研究所

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