Extraction of intrinsic response from s-parameters of laser diodes
文献类型：期刊论文
| 作者 | Zhu, NH; Chen, C; Pun, EYB; Chung, PS |
| 刊名 | Ieee photonics technology letters
 |
| 出版日期 | 2005-04-01 |
| 卷号 | 17期号:4页码:744-746 |
| 关键词 | Curve fitting Intrinsic response Laser diode Parasitic network S-parameters |
| ISSN号 | 1041-1135 |
| DOI | 10.1109/lpt.2004.842794 |
| 通讯作者 | Zhu, nh(nhzhu@red.semi.ac.cn) |
| 英文摘要 | We describe a new method for extracting the intrinsic response of a laser diode from s-parameters measured using a calibrated vector network analyzer. the experimental results obtained using the new method are compared with those obtained using the optical modulation method and the frequency response subtraction method. good agreement has been obtained, confirming the new method validity and accuracy. the new method has the advantages of obtaining the intrinsic characteristics of a laser diode with conventional measurements using a network analyzer. |
| WOS关键词 | SEMICONDUCTOR-LASERS ; MODULATION |
| WOS研究方向 | Engineering ; Optics ; Physics |
| WOS类目 | Engineering, Electrical & Electronic ; Optics ; Physics, Applied |
| 语种 | 英语 |
| WOS记录号 | WOS:000227871200005 |
| 出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2426284 |
| 专题 | 半导体研究所 |
| 通讯作者 | Zhu, NH |
| 作者单位 | 1.Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China 2.City Univ Hong Kong, Dept Elect Engn, Kowloon, Hong Kong, Peoples R China |
| 推荐引用方式 GB/T 7714 | Zhu, NH,Chen, C,Pun, EYB,et al. Extraction of intrinsic response from s-parameters of laser diodes[J]. Ieee photonics technology letters,2005,17(4):744-746. |
| APA | Zhu, NH,Chen, C,Pun, EYB,&Chung, PS.(2005).Extraction of intrinsic response from s-parameters of laser diodes.Ieee photonics technology letters,17(4),744-746. |
| MLA | Zhu, NH,et al."Extraction of intrinsic response from s-parameters of laser diodes".Ieee photonics technology letters 17.4(2005):744-746. |
入库方式： iSwitch采集
来源：半导体研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。