中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Qe and suns-v-oc study on the epitaxial csitf solar cells

文献类型:期刊论文

作者Bin, A; Shen, H; Ban, Q; Liang, ZC; Chen, RL; Shi, ZR; Liao, XB
刊名Science in china series e-engineering & materials science
出版日期2005-02-01
卷号48期号:1页码:41-52
关键词Ssp ribbon Crystalline silicon thin film solar cells Quantum efficiency Dark characteristics
ISSN号1006-9321
DOI10.1360/04ye0201
通讯作者Bin, a(aibin@ms.giec.ac.cn)
英文摘要In order to clarify the major factors having confined the efficiencies of as-prepared crystalline silicon thin film (csitf) solar cells on the ssp (silicon sheets from powder) ribbons, qe (quantum efficiency) and suns-v-oc study were performed on the epitaxial csitf solar cells fabricated on the ssp ribbons, the ssp ribbons after surface being zone melting recrystallized (zmr) and single crystalline silicon (sc-si) substrates. the results show that the epi-layers deposited on the ssp ribbons have rough surfaces, which not only increases the diffusion reflectance on the surfaces but also makes the anti-reflection coatings become structure-loosened, both of which would deteriorate the light trapping effect; in addition, the epi-layers deposited on the ssp ribbons possess poor crystallographic quality, so the heavy grain boundary (gb) recombination limits the diffusion length of the minority carriers in the epi-layers, which makes the as-prepared csitf solar cells suffer the worse spectra response at long-wavelength range. nearly all the dark characteristic parameters of the csitf solar cells are far away from the ideal values. the performances of the csitf solar cells are especially affected by too high i-02 (the dark saturation current of space charge region) values and too low r-sh (parallel resistance) values. the higher 102 values are mainly caused by the heavy gb recombination resulting from the poor crystallographic qualities of the silicon active layers in the space charge regions, while the lower r-sh values are attributed to the electrical leakage at the un-passivated pn junction or solar cell edges after the solar cells are cut by the laser scriber.
WOS关键词POLYCRYSTALLINE SILICON FILMS ; CRYSTALLINE SILICON ; SSP
WOS研究方向Engineering ; Materials Science
WOS类目Engineering, Multidisciplinary ; Materials Science, Multidisciplinary
语种英语
WOS记录号WOS:000228223500004
出版者SCIENCE CHINA PRESS
URI标识http://www.irgrid.ac.cn/handle/1471x/2426308
专题半导体研究所
通讯作者Bin, A
作者单位1.SUN YAT SEN Univ, Energy Engn Acad, Inst Solar Energy Syst, Guangzhou 510275, Peoples R China
2.Chinese Acad Sci, Guangzhou Inst Energy Convers, Guangzhou 510640, Peoples R China
3.Suntech Power Co Ltd, Wuxi 214028, Peoples R China
4.Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China
推荐引用方式
GB/T 7714
Bin, A,Shen, H,Ban, Q,et al. Qe and suns-v-oc study on the epitaxial csitf solar cells[J]. Science in china series e-engineering & materials science,2005,48(1):41-52.
APA Bin, A.,Shen, H.,Ban, Q.,Liang, ZC.,Chen, RL.,...&Liao, XB.(2005).Qe and suns-v-oc study on the epitaxial csitf solar cells.Science in china series e-engineering & materials science,48(1),41-52.
MLA Bin, A,et al."Qe and suns-v-oc study on the epitaxial csitf solar cells".Science in china series e-engineering & materials science 48.1(2005):41-52.

入库方式: iSwitch采集

来源:半导体研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。