中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Optical waveguide propagation loss measurement using multiple reflections method

文献类型:期刊论文

作者Chen, SW; Yan, QF; Xu, QY; Fan, ZC; Liu, JW
刊名Optics communications
出版日期2005-12-01
卷号256期号:1-3页码:68-72
关键词Optical waveguide Propagation loss Multiple reflections Reflectometer
ISSN号0030-4018
DOI10.1016/j.optcom.2005.06.043
通讯作者Chen, sw(swchen@red.semi.ac.cn)
英文摘要Optical waveguide propagation loss measurement method based on optical multiple reflections detection is presented in this paper. by using a precision reflectometer, uncertain influence on waveguide propagation loss measurement caused by fiber-waveguide coupling can be eliminated effectively and the waveguide net propagation loss can be measured accurately. to demonstrate this, the propagation loss of a silicon-on-insulator (soi) rib waveguide fabricated by rie is measured with the obtained value being 4.3 db/cm. this method provides a non-destructive means for evaluating waveguide propagation loss. (c) 2005 elsevier b.v. all rights reserved.
WOS研究方向Optics
WOS类目Optics
语种英语
WOS记录号WOS:000233219300007
出版者ELSEVIER SCIENCE BV
URI标识http://www.irgrid.ac.cn/handle/1471x/2426373
专题半导体研究所
通讯作者Chen, SW
作者单位Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
推荐引用方式
GB/T 7714
Chen, SW,Yan, QF,Xu, QY,et al. Optical waveguide propagation loss measurement using multiple reflections method[J]. Optics communications,2005,256(1-3):68-72.
APA Chen, SW,Yan, QF,Xu, QY,Fan, ZC,&Liu, JW.(2005).Optical waveguide propagation loss measurement using multiple reflections method.Optics communications,256(1-3),68-72.
MLA Chen, SW,et al."Optical waveguide propagation loss measurement using multiple reflections method".Optics communications 256.1-3(2005):68-72.

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来源:半导体研究所

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