An improved tm method for full two-port calibration of the asymmetric test fixtures
文献类型：期刊论文
| 作者 | Zhu, NH; Liu, C; Pun, EYB; Chung, PS |
| 刊名 | Microwave and optical technology letters
 |
| 出版日期 | 2005-06-05 |
| 卷号 | 45期号:5页码:438-441 |
| 关键词 | Calibration Deembedding Microwave network analyzer Test fixtures Scattering parameter measurement |
| ISSN号 | 0895-2477 |
| DOI | 10.1002/mop.20847 |
| 通讯作者 | Zhu, nh() |
| 英文摘要 | Three known standards, including at least one transmission standard, are normally required for the full two-port calibration of test fixtures. based on the triple-through method, a new general-purpose calibration procedure using only one known reflection standard is proposed in this paper. the experimental results show that our method call provide a simple and accurate approach to fall two-port calibration of the asymmetric test fixtures. (c) 2005 wiley periodicals, inc. |
| WOS关键词 | NETWORK-ANALYZER CALIBRATION ; MICROWAVE TEST FIXTURES |
| WOS研究方向 | Engineering ; Optics |
| WOS类目 | Engineering, Electrical & Electronic ; Optics |
| 语种 | 英语 |
| WOS记录号 | WOS:000228673400025 |
| 出版者 | JOHN WILEY & SONS INC |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2426388 |
| 专题 | 半导体研究所 |
| 通讯作者 | Zhu, NH |
| 作者单位 | 1.Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China 2.City Univ Hong Kong, Dept Elect Engn, Kowloon, Hong Kong, Peoples R China |
| 推荐引用方式 GB/T 7714 | Zhu, NH,Liu, C,Pun, EYB,et al. An improved tm method for full two-port calibration of the asymmetric test fixtures[J]. Microwave and optical technology letters,2005,45(5):438-441. |
| APA | Zhu, NH,Liu, C,Pun, EYB,&Chung, PS.(2005).An improved tm method for full two-port calibration of the asymmetric test fixtures.Microwave and optical technology letters,45(5),438-441. |
| MLA | Zhu, NH,et al."An improved tm method for full two-port calibration of the asymmetric test fixtures".Microwave and optical technology letters 45.5(2005):438-441. |
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来源：半导体研究所
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