中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Improved surface morphology of stacked 1.3 mu m inas/gaas quantum dot active regions by introducing annealing processes

文献类型:期刊论文

作者Yang, Tao; Tatebayashi, Jun; Nishioka, Masao; Arakawa, Yasuhiko
刊名Applied physics letters
出版日期2006-08-21
卷号89期号:8页码:3
ISSN号0003-6951
DOI10.1063/1.2337869
通讯作者Yang, tao(tyang@semi.ac.cn)
英文摘要The authors report a simple but effective way to improve the surface morphology of stacked 1.3 mu m inas/gaas quantum dot (qd) active regions grown by metal-organic chemical vapor deposition (mocvd), in which gaas middle spacer and top separate confining heterostructure (sch) layers are deposited at a low temperature of 560 degrees c to suppress postgrowth annealing effect that can blueshift emission wavelength of qds. by introducing annealing processes just after depositing the gaas spacer layers, the authors demonstrate that the surface morphology of the top gaas sch layer can be dramatically improved. for a model structure of five-layer qds, the surface roughness with the introduced annealing processes (iaps) is reduced to about 1.3 nm (5x5 mu m(2) area), much less than 4.2 nm without the iaps. furthermore, photoluminescence measurements show that inserting the annealing steps does not induce any changes in emission wavelength. this dramatic improvement in surface morphology results from the improved gaas spacer surfaces due to the iaps. the technique reported here has important implications for realizing stacked 1.3 mu m inas/gaas qd lasers based on mocvd.
WOS关键词CHEMICAL-VAPOR-DEPOSITION ; THRESHOLD CURRENT ; ROOM-TEMPERATURE ; LASERS ; MODULATION ; LAYER
WOS研究方向Physics
WOS类目Physics, Applied
语种英语
WOS记录号WOS:000240035400034
出版者AMER INST PHYSICS
URI标识http://www.irgrid.ac.cn/handle/1471x/2426564
专题半导体研究所
通讯作者Yang, Tao
作者单位1.Chinese Acad Sci, Inst Semicond, Nanooptoelect Lab, Beijing 100083, Peoples R China
2.Univ Tokyo, Inst Ind Sci, Meguro Ku, Tokyo 1538505, Japan
推荐引用方式
GB/T 7714
Yang, Tao,Tatebayashi, Jun,Nishioka, Masao,et al. Improved surface morphology of stacked 1.3 mu m inas/gaas quantum dot active regions by introducing annealing processes[J]. Applied physics letters,2006,89(8):3.
APA Yang, Tao,Tatebayashi, Jun,Nishioka, Masao,&Arakawa, Yasuhiko.(2006).Improved surface morphology of stacked 1.3 mu m inas/gaas quantum dot active regions by introducing annealing processes.Applied physics letters,89(8),3.
MLA Yang, Tao,et al."Improved surface morphology of stacked 1.3 mu m inas/gaas quantum dot active regions by introducing annealing processes".Applied physics letters 89.8(2006):3.

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来源:半导体研究所

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