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Chinese Academy of Sciences Institutional Repositories Grid
Mutual passivation of donors and isovalent nitrogen in gaas

文献类型:期刊论文

作者Li, J; Carrier, P; Wei, SH; Li, SS; Xia, JB
刊名Physical review letters
出版日期2006-01-27
卷号96期号:3页码:4
ISSN号0031-9007
DOI10.1103/physrevlett.96.035505
通讯作者Li, j()
英文摘要We study the mutual passivation of shallow donor and isovalent n in gaas. we find that all the donor impurities, si(ga), ge(ga), s(as), and se(as), bind to n in gaasn, which has a large n-induced band-gap reduction relative to gaas. for a group-iv impurity such as si, the formation of the nearest-neighbor si(ga)-n(as) defect complex creates a deep donor level below the conduction band minimum (cbm). the coupling between this defect level with the cbm pushes the cbm upwards, thus restoring the gaas band gap; the lowering of the defect level relative to the isolated si(ga) shallow donor level is responsible for the increased electrical resistivity. therefore, si and n mutually passivate each other's electrical and optical activities in gaas. for a group-vi shallow donor such as s, the binding between s(as) and n(as) does not form a direct bond; therefore, no mutual passivation exists in the gaas(s+n) system.
WOS关键词DILUTED GANXAS1-X ALLOYS ; GROUP-IV DONORS ; SEMICONDUCTOR ALLOYS ; OPTICAL-PROPERTIES ; BAND ; GAN(X)AS1-X ; IMPURITIES ; HYDROGEN
WOS研究方向Physics
WOS类目Physics, Multidisciplinary
语种英语
WOS记录号WOS:000234969300060
出版者AMER PHYSICAL SOC
URI标识http://www.irgrid.ac.cn/handle/1471x/2426569
专题半导体研究所
通讯作者Li, J
作者单位1.Natl Renewable Energy Lab, Golden, CO 80401 USA
2.Chinese Acad Sci, State Key Lab Superlattices & Microstruct, Inst Semicond, Beijing 100083, Peoples R China
推荐引用方式
GB/T 7714
Li, J,Carrier, P,Wei, SH,et al. Mutual passivation of donors and isovalent nitrogen in gaas[J]. Physical review letters,2006,96(3):4.
APA Li, J,Carrier, P,Wei, SH,Li, SS,&Xia, JB.(2006).Mutual passivation of donors and isovalent nitrogen in gaas.Physical review letters,96(3),4.
MLA Li, J,et al."Mutual passivation of donors and isovalent nitrogen in gaas".Physical review letters 96.3(2006):4.

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来源:半导体研究所

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