中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
High-performance eml grown on taper-masked pattern substrates by ultra-low-pressure mocvd

文献类型:期刊论文

作者Zhao, Q; Pan, JQ; Zhang, J; Zhu, HL; Wang, W
刊名Journal of crystal growth
出版日期2006-02-02
卷号288期号:1页码:27-31
关键词Selective area growth Ultra-low pressure Ingaasp Tapered mask Integrated device
ISSN号0022-0248
DOI10.1016/j.jcrysgro.2005.12.027
通讯作者Zhao, q(qzhao@red.semi.ac.cn)
英文摘要A novel in-plane bandgap energy controlling technique by ultra-low pressure (22 mbar) selective area growth (sag) has been developed. to our knowledge, this is the lowest pressure condition during sag process ever reported. in this work, high crystalline quality ingaasp-inp mqws with a photoluminescence (pl) full-width at half-maximum (fwhm) of less than 35mev are selectively grown on mask-patterned planar inp substrates by ultra-low pressure (22 mbar) metal-organic chemical vapor deposition (mocvd). in order to study the uniformity of the mqws grown in the selective area, novel tapered masks are designed and used. through optimizing growth conditions, a wide wavelength shift of over 80 nm with a rather small mask width variation (0-30 mu m) is obtained. the mechanism of ultra-low pressure sag is detailed by analyzing the effect of various mask designs and quantum well widths. this powerful technique is then applied to fabricate an electroabsorption-modulated laser (eml). superior device characteristics are achieved, such as a low threshold current of 19ma and an output power of 7mw. (c) 2005 elsevier b.v. all rights reserved.
WOS关键词BURIED-HETEROSTRUCTURE ; MONOLITHIC INTEGRATION ; SELECTIVE MOVPE ; LASER ; MODULATOR
WOS研究方向Crystallography ; Materials Science ; Physics
WOS类目Crystallography ; Materials Science, Multidisciplinary ; Physics, Applied
语种英语
WOS记录号WOS:000235581800007
出版者ELSEVIER SCIENCE BV
URI标识http://www.irgrid.ac.cn/handle/1471x/2426669
专题半导体研究所
通讯作者Zhao, Q
作者单位Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China
推荐引用方式
GB/T 7714
Zhao, Q,Pan, JQ,Zhang, J,et al. High-performance eml grown on taper-masked pattern substrates by ultra-low-pressure mocvd[J]. Journal of crystal growth,2006,288(1):27-31.
APA Zhao, Q,Pan, JQ,Zhang, J,Zhu, HL,&Wang, W.(2006).High-performance eml grown on taper-masked pattern substrates by ultra-low-pressure mocvd.Journal of crystal growth,288(1),27-31.
MLA Zhao, Q,et al."High-performance eml grown on taper-masked pattern substrates by ultra-low-pressure mocvd".Journal of crystal growth 288.1(2006):27-31.

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来源:半导体研究所

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