Analysis of mode quality factors and mode reflectivities for nanowire cavity by fdtd technique
文献类型：期刊论文
| 作者 | Wang, MQ; Huang, YZ; Chen, Q; Cai, ZP |
| 刊名 | Ieee journal of quantum electronics
 |
| 出版日期 | 2006 |
| 卷号 | 42期号:1-2页码:146-151 |
| 关键词 | Cavity resonators Fdtd methods Laser modes Nanowire cavity Quality factor Reflection coefficient |
| ISSN号 | 0018-9197 |
| DOI | 10.1109/jqe.2005.861823 |
| 通讯作者 | Wang, mq() |
| 英文摘要 | The mode frequency and the quality factor of nanowire cavities are calculated from the intensity spectrum obtained by the finite-difference time-domain (fdtd) technique and the pade approximation. in a free-standing nanowire cavity with dielectric constant epsilon = 6.0 and a length of 5 mu m, quality factors of 130, 159, and 151 are obtained for the he11 modes with a wavelength around 375 nm, at cavity radius of 60, 75, and 90 nm, respectively. the corresponding quality factors reduce to 78, 94, and 86 for a nanowire cavity standing on a sapphire substrate with a refractive index of 1.8. the mode quality factors are also calculated for the te01 and tm01 modes, and the mode reflectivities are calculated from the mode quality factors. |
| WOS关键词 | INDIUM-PHOSPHIDE NANOWIRES ; PADE-APPROXIMATION ; LASER ; GAIN |
| WOS研究方向 | Engineering ; Optics ; Physics |
| WOS类目 | Engineering, Electrical & Electronic ; Optics ; Physics, Applied |
| 语种 | 英语 |
| WOS记录号 | WOS:000235294000019 |
| 出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2426708 |
| 专题 | 半导体研究所 |
| 通讯作者 | Wang, MQ |
| 作者单位 | 1.Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China 2.Xiamen Univ, Dept Phys, Xiamen 361005, Peoples R China 3.Huaqiao Univ, Coll Informat Sci & Engn, Quanzhou 362021, Peoples R China 4.Xiamen Univ, Dept Elect Engn, Xiamen 361005, Peoples R China |
| 推荐引用方式 GB/T 7714 | Wang, MQ,Huang, YZ,Chen, Q,et al. Analysis of mode quality factors and mode reflectivities for nanowire cavity by fdtd technique[J]. Ieee journal of quantum electronics,2006,42(1-2):146-151. |
| APA | Wang, MQ,Huang, YZ,Chen, Q,&Cai, ZP.(2006).Analysis of mode quality factors and mode reflectivities for nanowire cavity by fdtd technique.Ieee journal of quantum electronics,42(1-2),146-151. |
| MLA | Wang, MQ,et al."Analysis of mode quality factors and mode reflectivities for nanowire cavity by fdtd technique".Ieee journal of quantum electronics 42.1-2(2006):146-151. |
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来源：半导体研究所
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