Detect the sub-wavelength data by applying a very-small-aperture laser
文献类型:期刊论文
作者 | Gan, Q; Song, G; Yang, G; Li, Y; Chen, L |
刊名 | Laser physics letters
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出版日期 | 2006-04-01 |
卷号 | 3期号:4页码:185-189 |
关键词 | Near-field optics Apertures Scanning microscopy Very-small-aperture lasers |
ISSN号 | 1612-2011 |
DOI | 10.1002/lapl.200510076 |
通讯作者 | Gan, q(gqq@red.semi.ac.cn) |
英文摘要 | We present a theoretical and experimental research about applying a very-small-aperture laser (vsal) to detect sub-wavelength data. near-field distribution of a vsal, which is essential for the application of such near-field devices, will be affected by the sample or fiber posited in the near-field region of the aperture. when the device is applied to detect the sub-wavelength data, the real resolution depends on the near-field spot size, the divergent angle of the beam and the distance from the aperture to the sample. experimental results, including the near-field detection of the spot and detection of the sub-wavelength data by using the vsal, are presented in this paper. we realize the two dimensional scanning about the sub-wavelength data (with the width 600 nm) by employing a vsal with a 300 nm x 300 nm aperture. |
WOS关键词 | LIGHT |
WOS研究方向 | Optics ; Physics |
WOS类目 | Optics ; Physics, Applied |
语种 | 英语 |
WOS记录号 | WOS:000236692900004 |
出版者 | WILEY-V C H VERLAG GMBH |
URI标识 | http://www.irgrid.ac.cn/handle/1471x/2426832 |
专题 | 半导体研究所 |
通讯作者 | Gan, Q |
作者单位 | 1.Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China 2.Grad Univ Chinese Acad Sci, Beijing 100039, Peoples R China |
推荐引用方式 GB/T 7714 | Gan, Q,Song, G,Yang, G,et al. Detect the sub-wavelength data by applying a very-small-aperture laser[J]. Laser physics letters,2006,3(4):185-189. |
APA | Gan, Q,Song, G,Yang, G,Li, Y,&Chen, L.(2006).Detect the sub-wavelength data by applying a very-small-aperture laser.Laser physics letters,3(4),185-189. |
MLA | Gan, Q,et al."Detect the sub-wavelength data by applying a very-small-aperture laser".Laser physics letters 3.4(2006):185-189. |
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来源:半导体研究所
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