Measurement of a reciprocal four-port transmission line structure using the 16-term error model
文献类型：期刊论文
| 作者 | Zhang, Yun; Silvonen, Kirnmo; Zhu, Ning H. |
| 刊名 | Microwave and optical technology letters
 |
| 出版日期 | 2007-07-01 |
| 卷号 | 49期号:7页码:1511-1515 |
| 关键词 | 16-term error model Four-port Transmission lines Calibration Error sensitivity Deembedding Scattering parameters Test fixture |
| ISSN号 | 0895-2477 |
| DOI | 10.1002/mop.22498 |
| 通讯作者 | Zhang, yun() |
| 英文摘要 | A new method to measure reciprocal four-port structures, using a 16-term error model, is presented. the measurement is based on 5 two-port calibration standards connected to two of the ports, while the network analyzer is connected to the two remaining ports. least-squares-fit data reduction techniques are used to lower error sensitivity. the effect of connectors is deembedded using closed-form equations. (c) 2007 wiley periodicals, inc. |
| WOS关键词 | NETWORK-ANALYZER CALIBRATION ; SCATTERING MATRIX ; MULTIPORT ; PORTS |
| WOS研究方向 | Engineering ; Optics |
| WOS类目 | Engineering, Electrical & Electronic ; Optics |
| 语种 | 英语 |
| WOS记录号 | WOS:000246557100004 |
| 出版者 | JOHN WILEY & SONS INC |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2426987 |
| 专题 | 半导体研究所 |
| 通讯作者 | Zhang, Yun |
| 作者单位 | 1.Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China 2.Helsinki Univ Technol, Circuit Theory Lab, Dept Elect & Commun Engn, FI-02015 Helsinki, Finland |
| 推荐引用方式 GB/T 7714 | Zhang, Yun,Silvonen, Kirnmo,Zhu, Ning H.. Measurement of a reciprocal four-port transmission line structure using the 16-term error model[J]. Microwave and optical technology letters,2007,49(7):1511-1515. |
| APA | Zhang, Yun,Silvonen, Kirnmo,&Zhu, Ning H..(2007).Measurement of a reciprocal four-port transmission line structure using the 16-term error model.Microwave and optical technology letters,49(7),1511-1515. |
| MLA | Zhang, Yun,et al."Measurement of a reciprocal four-port transmission line structure using the 16-term error model".Microwave and optical technology letters 49.7(2007):1511-1515. |
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来源：半导体研究所
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