中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A study on the minority carrier diffusion length in n-type gan films

文献类型:期刊论文

作者Deng Dongmei; Zhao Degang; Wang Jinyan; Yang Hui; Wen Cheng Paul
刊名Rare metals
出版日期2007-06-01
卷号26期号:3页码:271-275
关键词Compound semiconductor material Minority carrier diffusion length Photovoltaic spectrum Gan
ISSN号1001-0521
通讯作者Deng dongmei(dmdeng@ime.pku.edu.cn)
英文摘要The minority carrier diffusion length of n-type gan films grown by metalorganic chemical vapor deposition (mocvd) has been studied by measuring the surface photovoltaic (pv) spectra. it was found that the minority carrier diffusion length of undoped n-type gan is considerably larger than that in lightly si-doped gan. however, the data suggested that the dislocation and electron concentration appear not to be responsible for the minority carrier diffusion length. it is suggested that si doping plays an important role in decreasing the minority carrier diffusion length.
WOS研究方向Materials Science ; Metallurgy & Metallurgical Engineering
WOS类目Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
语种英语
WOS记录号WOS:000247953500014
出版者NONFERROUS METALS SOCIETY CHINA
URI标识http://www.irgrid.ac.cn/handle/1471x/2427089
专题半导体研究所
通讯作者Deng Dongmei
作者单位1.Peking Univ, Inst Microelect, Beijing 100871, Peoples R China
2.Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
推荐引用方式
GB/T 7714
Deng Dongmei,Zhao Degang,Wang Jinyan,et al. A study on the minority carrier diffusion length in n-type gan films[J]. Rare metals,2007,26(3):271-275.
APA Deng Dongmei,Zhao Degang,Wang Jinyan,Yang Hui,&Wen Cheng Paul.(2007).A study on the minority carrier diffusion length in n-type gan films.Rare metals,26(3),271-275.
MLA Deng Dongmei,et al."A study on the minority carrier diffusion length in n-type gan films".Rare metals 26.3(2007):271-275.

入库方式: iSwitch采集

来源:半导体研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。