中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Influence of v/iii ratio on the structural and photoluminescence properties of in0.52alas/in0.53gaas metamorphic high electron mobility transistor grown by molecular beam epitaxy

文献类型:期刊论文

作者Gao Hong-Ling1; Zeng Yi-Peng1; Wang Bao-Qiang1; Zhu Zhan-Ping1; Wang Zhan-Guo2
刊名Chinese physics b
出版日期2008-03-01
卷号17期号:3页码:1119-1123
关键词Molecular beam epitaxy Semiconducting iii-v materials High electron mobility transistors
ISSN号1674-1056
通讯作者Gao hong-ling(hlgao@semi.ac.cn)
英文摘要A series of metamorphic high electron mobility transistors (mmhemts) with different v/iii flux ratios are grown on gaas (001) substrates by molecular beam epitaxy (xibe). the samples are analysed by using atomic force microscopy (afm), hall measurement, and low temperature photoluminescence (pl). the optimum v/iii ratio in a range from 15 to 60 for the growth of mmhemts is found to be around 40. at this ratio, the root mean square (rms) roughness of the material is only 2.02 nm; a room-temperature mobility and a sheet electron density are obtained to be 10610.0cm(2)/(v.s) and 3.26 x 10(12)cm(-2) respectively. these results are equivalent to those obtained for the same structure grown on inp substrate. there are two peaks in the pl spectrum of the structure, corresponding to two sub-energy levels of the in0.53ga0.47 as quantum well. it is found that the photoluminescence intensities of the two peaks vary with the v/iii ratio, for which the reasons are discussed.
WOS关键词INALAS/INGAAS/INP HEMTS ; LOW-TEMPERATURE ; GAAS SUBSTRATE ; SURFACE ; GAS ; LENGTH ; WELLS
WOS研究方向Physics
WOS类目Physics, Multidisciplinary
语种英语
WOS记录号WOS:000254288400061
出版者IOP PUBLISHING LTD
URI标识http://www.irgrid.ac.cn/handle/1471x/2427395
专题半导体研究所
通讯作者Gao Hong-Ling
作者单位1.Chinese Acad Sci, Inst Semicond, Novel Mat Lab, Beijing 100083, Peoples R China
2.Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China
推荐引用方式
GB/T 7714
Gao Hong-Ling,Zeng Yi-Peng,Wang Bao-Qiang,et al. Influence of v/iii ratio on the structural and photoluminescence properties of in0.52alas/in0.53gaas metamorphic high electron mobility transistor grown by molecular beam epitaxy[J]. Chinese physics b,2008,17(3):1119-1123.
APA Gao Hong-Ling,Zeng Yi-Peng,Wang Bao-Qiang,Zhu Zhan-Ping,&Wang Zhan-Guo.(2008).Influence of v/iii ratio on the structural and photoluminescence properties of in0.52alas/in0.53gaas metamorphic high electron mobility transistor grown by molecular beam epitaxy.Chinese physics b,17(3),1119-1123.
MLA Gao Hong-Ling,et al."Influence of v/iii ratio on the structural and photoluminescence properties of in0.52alas/in0.53gaas metamorphic high electron mobility transistor grown by molecular beam epitaxy".Chinese physics b 17.3(2008):1119-1123.

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来源:半导体研究所

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