Characterization of parasitics from scattering parameters of laser diode
文献类型:期刊论文
作者 | Zhang, Shangjian1,2; Zhu, Ninghua2; Liu, Yong1; Liu, Yongzhi1 |
刊名 | Microwave and optical technology letters
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出版日期 | 2008 |
卷号 | 50期号:1页码:1-4 |
关键词 | Semiconductor lasers Parasitic network Parasitics Scattering parameters |
ISSN号 | 0895-2477 |
DOI | 10.1002/mop.22987 |
通讯作者 | Zhang, shangjian(sjzhang@uestc.edu.cn) |
英文摘要 | A novel method for characterizing the parasitics of parasitic network is proposed based on the relations between the scattering parameters of a semiconductor laser chip and laser diode. experiments are designed and performed using our method. the analysis results are in good agreement with the measurements. furthermore, how the parasitics change with the parasitic element values are investigated. the method only needs reflection coefficient of laser diode to be measured, which is simple because of the developed electrical-domain measurement techniques. 2007 wiley periodicals, inc. |
WOS关键词 | SEMICONDUCTOR-LASERS ; MODULATION ; EXTRACTION |
WOS研究方向 | Engineering ; Optics |
WOS类目 | Engineering, Electrical & Electronic ; Optics |
语种 | 英语 |
WOS记录号 | WOS:000251856500001 |
出版者 | JOHN WILEY & SONS INC |
URI标识 | http://www.irgrid.ac.cn/handle/1471x/2427489 |
专题 | 半导体研究所 |
通讯作者 | Zhang, Shangjian |
作者单位 | 1.Univ Elect Sci & Technol China, Sch Optoelect Informat, Chengdu 610054, Peoples R China 2.Chinese Acad Sci, Inst Semicond, State Key Lab Integrat Optoelect, Beijing 100083, Peoples R China |
推荐引用方式 GB/T 7714 | Zhang, Shangjian,Zhu, Ninghua,Liu, Yong,et al. Characterization of parasitics from scattering parameters of laser diode[J]. Microwave and optical technology letters,2008,50(1):1-4. |
APA | Zhang, Shangjian,Zhu, Ninghua,Liu, Yong,&Liu, Yongzhi.(2008).Characterization of parasitics from scattering parameters of laser diode.Microwave and optical technology letters,50(1),1-4. |
MLA | Zhang, Shangjian,et al."Characterization of parasitics from scattering parameters of laser diode".Microwave and optical technology letters 50.1(2008):1-4. |
入库方式: iSwitch采集
来源:半导体研究所
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