中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Gaas based inas/gasb superlattice short wavelength infrared detectors grown by molecular beam epitaxy

文献类型:期刊论文

作者Tang Bao; Xu Ying-Qiang; Zhou Zhi-Qiang; Hao Rui-Ting; Wang Guo-Wei; Ren Zheng-Wei; Niu Zhi-Chuan
刊名Chinese physics letters
出版日期2009-02-01
卷号26期号:2页码:3
ISSN号0256-307X
通讯作者Xu ying-qiang(yingqxu@semi.ac.cn)
英文摘要Inas/gasb superlattice (sl) short wavelength infrared photoconduction detectors are grown by molecular beam epitaxy on gaas(001) semi-insulating substrates. an interfacial misfit mode alsb quantum dot layer and a thick gasb layer are grown as buffer layers. the detectors containing a 200-period 2ml/8ml inas/gasb sl active layer are fabricated with a pixel area of 800 x 800 mu m(2) without using passivation or antireflection coatings. corresponding to the 50% cutoff wavelengths of 2.05 mu m at 77k and 2.25 mu m at 300 k, the peak detectivities of the detectors are 4 x 10(9) cm.hz(1/2)/w at 77k and 2 x 10(8) cm.hz(1/2)/w at 300 k, respectively.
WOS关键词INAS/GA1-XINXSB SUPERLATTICE ; GASB ; HETEROJUNCTIONS ; PHOTODIODES ; SEGREGATION ; LAYERS ; INAS ; ALSB
WOS研究方向Physics
WOS类目Physics, Multidisciplinary
语种英语
出版者IOP PUBLISHING LTD
WOS记录号WOS:000263243800073
URI标识http://www.irgrid.ac.cn/handle/1471x/2427639
专题半导体研究所
通讯作者Xu Ying-Qiang
作者单位Chinese Acad Sci, Inst Semicond, State Key Lab Superlattices & Microstruct, Beijing 100083, Peoples R China
推荐引用方式
GB/T 7714
Tang Bao,Xu Ying-Qiang,Zhou Zhi-Qiang,et al. Gaas based inas/gasb superlattice short wavelength infrared detectors grown by molecular beam epitaxy[J]. Chinese physics letters,2009,26(2):3.
APA Tang Bao.,Xu Ying-Qiang.,Zhou Zhi-Qiang.,Hao Rui-Ting.,Wang Guo-Wei.,...&Niu Zhi-Chuan.(2009).Gaas based inas/gasb superlattice short wavelength infrared detectors grown by molecular beam epitaxy.Chinese physics letters,26(2),3.
MLA Tang Bao,et al."Gaas based inas/gasb superlattice short wavelength infrared detectors grown by molecular beam epitaxy".Chinese physics letters 26.2(2009):3.

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来源:半导体研究所

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