Investigation of mode radiation loss for microdisk resonators with pedestals by fdtd technique
文献类型:期刊论文
作者 | Yang, Yuede; Wang, Shijiang; Huang, Yongzhen |
刊名 | Chinese optics letters |
出版日期 | 2010-05-10 |
卷号 | 8期号:5页码:502-504 |
ISSN号 | 1671-7694 |
DOI | 10.3788/col20100805.0502 |
通讯作者 | Yang, yuede(yyd@semi.ac.cn) |
英文摘要 | Mode radiation loss for microdisk resonators with pedestals is investigated by three-dimensional (3d) finite-difference time-domain (fdtd) technique. for the microdisk with a radius of 1 mu m, a thickness of 0.2 mu m, and a refractive index of 3.4, on a pedestal with a refractive index of 3.17, the mode quality (q) factor of the whispering-gallery mode (wgm) quasi-te(7,1) first increases with the increase of the radius of the pedestal, and then quickly decreases as the radius is larger than 0.75 mu m. the mode radiation loss is mainly the vertical radiation loss induced by the mode coupling between the wgm and vertical radiation mode in the pedestal, instead of the scattering loss around the perimeter of the round pedestal. the wg m can keep the high q factor when the mode coupling is forbidden. |
WOS关键词 | WHISPERING-GALLERY MODES ; LASERS |
WOS研究方向 | Optics |
WOS类目 | Optics |
语种 | 英语 |
出版者 | CHINESE OPTICS LETTERS MANUSCRIPT OFFICE |
WOS记录号 | WOS:000277920900019 |
URI标识 | http://www.irgrid.ac.cn/handle/1471x/2427828 |
专题 | 半导体研究所 |
通讯作者 | Yang, Yuede |
作者单位 | Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China |
推荐引用方式 GB/T 7714 | Yang, Yuede,Wang, Shijiang,Huang, Yongzhen. Investigation of mode radiation loss for microdisk resonators with pedestals by fdtd technique[J]. Chinese optics letters,2010,8(5):502-504. |
APA | Yang, Yuede,Wang, Shijiang,&Huang, Yongzhen.(2010).Investigation of mode radiation loss for microdisk resonators with pedestals by fdtd technique.Chinese optics letters,8(5),502-504. |
MLA | Yang, Yuede,et al."Investigation of mode radiation loss for microdisk resonators with pedestals by fdtd technique".Chinese optics letters 8.5(2010):502-504. |
入库方式: iSwitch采集
来源:半导体研究所
浏览0
下载0
收藏0
其他版本
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。