中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Low threshold current density, low resistance oxide-confined vcsel fabricated by a dielectric-free approach

文献类型:期刊论文

作者Ding, Y.1; Fan, W. J.1; Xu, D. W.1; Tong, C. Z.1; Liu, Y.2; Zhao, L. J.3
刊名Applied physics b-lasers and optics
出版日期2010-03-01
卷号98期号:4页码:773-778
ISSN号0946-2171
DOI10.1007/s00340-009-3810-7
通讯作者Ding, y.(yding@ntu.edu.sg)
英文摘要We present the fabrication process and experimental results of 850-nm oxide-confined vertical cavity surface emitting lasers (vcsels) fabricated by using dielectric-free approach. the threshold current of 0.4 ma, which corresponds to the threshold current density of 0.5 ka/cm(2), differential resistance of 76 omega, and maximum output power of more than 5 mw are achieved for the dielectric-free vcsel with a square oxide aperture size of 9 mu m at room temperature (rt). l-i-v characteristics of the dielectric-free vcsel are compared with those of conventional vcsel with the similar aperture size, which indicates the way to realize low-cost, low-power consumption vcsels with extremely simple process. preliminary study of the temperature-dependent l-i characteristics and modulation response of the dielectric-free vcsel are also presented.
WOS关键词SURFACE-EMITTING LASERS ; HIGH-SPEED ; APERTURE ; GBIT/S ; LAYERS
WOS研究方向Optics ; Physics
WOS类目Optics ; Physics, Applied
语种英语
出版者SPRINGER
WOS记录号WOS:000274685500025
URI标识http://www.irgrid.ac.cn/handle/1471x/2427843
专题半导体研究所
通讯作者Ding, Y.
作者单位1.Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore
2.Chinese Acad Sci, Inst Semicond, Optoelect R&D Ctr, Beijing 100083, Peoples R China
3.Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China
推荐引用方式
GB/T 7714
Ding, Y.,Fan, W. J.,Xu, D. W.,et al. Low threshold current density, low resistance oxide-confined vcsel fabricated by a dielectric-free approach[J]. Applied physics b-lasers and optics,2010,98(4):773-778.
APA Ding, Y.,Fan, W. J.,Xu, D. W.,Tong, C. Z.,Liu, Y.,&Zhao, L. J..(2010).Low threshold current density, low resistance oxide-confined vcsel fabricated by a dielectric-free approach.Applied physics b-lasers and optics,98(4),773-778.
MLA Ding, Y.,et al."Low threshold current density, low resistance oxide-confined vcsel fabricated by a dielectric-free approach".Applied physics b-lasers and optics 98.4(2010):773-778.

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来源:半导体研究所

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