中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Experimental study on the subthreshold swing of silicon nanowire transistors

文献类型:期刊论文

作者Zhang, Yanbo1; Xiong, Ying1; Yang, Xiang1; Wang, Ying1; Han, Weihua1; Yang, Fuhua1,2
刊名Journal of nanoscience and nanotechnology
出版日期2010-11-01
卷号10期号:11页码:7113-7116
关键词Subthreshold swing (ss) Silicon-on-insulator (soi) Nanowire Wrap gate Side gates
ISSN号1533-4880
DOI10.1166/jnn.2010.2811
通讯作者Han, weihua()
英文摘要Soi based wrap-gate silicon nanowire fets are fabricated through electron beam lithography and wet etching. dry thermal oxidation is used to further reduce the patterned fins cross section and transfer them into nanowires. silicon nanowire fets with different nanowire widths varying from 60 nm to 200 nm are fabricated and the number of the nanowires contained in a channel is also varied. the on-current (i(on)) and off-current (i(off)) of the fabricated silicon nanowire fet are 0.59 mu a and 0.19 na respectively. the subthreshold swing (ss) and the drain induced barrier lowering are 580 mv/dec and 149 mvn respectively due to the 30 nm thick gate oxide and 1015 cm(-3) lightly doped silicon nanowire channel. the nanowire width dependence of ss is shown and attributed to the fact that the side-gate parts of a wrap gate play a more effectual role as the nanowires in a channel get narrower. it seems the nanowire number in a channel has no effect on ss because the side-gate parts fill in the space between two adjacent nanowires.
WOS关键词SOI MOSFETS
WOS研究方向Chemistry ; Science & Technology - Other Topics ; Materials Science ; Physics
WOS类目Chemistry, Multidisciplinary ; Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied ; Physics, Condensed Matter
语种英语
WOS记录号WOS:000283621300025
出版者AMER SCIENTIFIC PUBLISHERS
URI标识http://www.irgrid.ac.cn/handle/1471x/2427931
专题半导体研究所
通讯作者Han, Weihua
作者单位1.Chinese Acad Sci, Inst Semicond, Res Ctr Semicond Integrat Technol, Beijing 100083, Peoples R China
2.State Key Lab Superlattices & Microstruct, Beijing 100083, Peoples R China
推荐引用方式
GB/T 7714
Zhang, Yanbo,Xiong, Ying,Yang, Xiang,et al. Experimental study on the subthreshold swing of silicon nanowire transistors[J]. Journal of nanoscience and nanotechnology,2010,10(11):7113-7116.
APA Zhang, Yanbo,Xiong, Ying,Yang, Xiang,Wang, Ying,Han, Weihua,&Yang, Fuhua.(2010).Experimental study on the subthreshold swing of silicon nanowire transistors.Journal of nanoscience and nanotechnology,10(11),7113-7116.
MLA Zhang, Yanbo,et al."Experimental study on the subthreshold swing of silicon nanowire transistors".Journal of nanoscience and nanotechnology 10.11(2010):7113-7116.

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来源:半导体研究所

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